Inventor · disambiguated record
Chin-Min Lin
Also filed as: LIN CHIN-MIN
32 granted patents·6 pending applications·98 citations·filing 2005–2025
96Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD24TAIWAN SEMICONDUCTOR MFG8AU OPTRONICS CORP2LIN CHIN-MIN1LIU KE CHUN1
Top patents by PatentIndex Score
38 records- 0195US9656857B2Microelectromechanical systems (MEMS) devices at different pressuresTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted May 23, 2017·13 cites·20 claims
- 0294US9711562B2Apparatus and method for reducing optical cross-talk in image sensorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jul 18, 2017·7 cites·20 claims
- 0392US9550667B1Semiconductor structure and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jan 24, 2017·10 cites·20 claims
- 0491US11861928B2Optical sensor and methods of making the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jan 2, 2024·1 cites·20 claims
- 0591US9473753B2Apparatus and method for reducing optical cross-talk in image sensorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2012·Granted Oct 18, 2016·7 cites·20 claims
- 0690US11289533B2Biometric sensor and methods thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Mar 29, 2022·2 cites·20 claims
- 0789US10556792B2Wafer level integrated MEMS device enabled by silicon pillar and smart capTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Feb 11, 2020·3 cites·20 claims
- 0889US10522586B2Apparatus for reducing optical cross-talk in image sensorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 31, 2019·3 cites·20 claims
- 0989US7446294B2True color image by modified microlens arrayTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Nov 4, 2008·11 cites·5 claims
- 1088US9966412B2Method for reducing optical cross-talk in image sensorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted May 8, 2018·3 cites·20 claims
- 1188US2025364495A1Multi-wafer integrationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1287US11069731B2Apparatus for reducing optical cross-talk in image sensorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jul 20, 2021·2 cites·20 claims
- 1387US10961118B2Wafer level integrated MEMS device enabled by silicon pillar and smart capTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Mar 30, 2021·2 cites·20 claims
- 1486US9630832B2Semiconductor device and method of manufacturingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Apr 25, 2017·6 cites·20 claims
- 1585US2024371911A1Biometric sensor and methods thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1683US12463181B2Multi-wafer integrationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Nov 4, 2025·0 cites·20 claims
- 1778US12148236B2Optical sensor and methods of making the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Nov 19, 2024·0 cites·20 claims
- 1878US12094914B2Biometric sensor and methods thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 17, 2024·0 cites·20 claims
- 1978US11514707B2Optical sensor and methods of making the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Nov 29, 2022·1 cites·19 claims
- 2078US10763296B2Biometric sensor and methods thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Sep 1, 2020·2 cites·20 claims
- 2177US7642500B2True color image by modified microlens array having different effective areasTAIWAN SEMICONDUCTOR MFG·Filed 2008·Granted Jan 5, 2010·3 cites·16 claims
- 2276US9856139B2Microelectromechanical systems (MEMS) devices at different pressuresTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jan 2, 2018·1 cites·20 claims
- 2375US7750470B2Methods for planarization of dielectric layer around metal patterns for optical efficiency enhancementTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Jul 6, 2010·5 cites·11 claims
- 2473US11756972B2Apparatus for reducing optical cross-talk in image sensorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Sep 12, 2023·0 cites·20 claims
- 2572US11916043B2Multi-wafer integrationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Feb 27, 2024·0 cites·20 claims
- 2671US9965194B2Data writing method, memory control circuit unit and memory storage apparatus which performs data arrangement operation according to usage frequency of physical erasing unit of memory storage apparatusPHISON ELECTRONICS CORP·Filed 2016·Granted May 8, 2018·2 cites·27 claims
- 2771US8175735B2System and method of multi-objective capacity planning in TFT-LCD panel manufacturing industryWANG KUNG-JENG·Filed 2009·Granted May 8, 2012·5 cites·9 claims
- 2871US7196012B2Methods for planarization of dielectric layer around metal patterns for optical efficiency enhancementTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Mar 27, 2007·5 cites·20 claims
- 2969US10899608B2Wafer level integrated MEMS device enabled by silicon pillar and smart capTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jan 26, 2021·0 cites·20 claims
- 3069US7755120B2Semiconductor deviceTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Jul 13, 2010·4 cites·17 claims
- 3157US2009020838A1Apparatus and method for reducing optical cross-talk in image sensorsTAIWAN SEMICONDUCTOR MFG·Filed 2007·Application pending·0 cites
- 3255US8030114B2Method and structure to reduce dark current in image sensorsTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Oct 4, 2011·0 cites·17 claims
- 3351US2014062913A1Method for detecting touch point of multi-type objectsAU OPTRONICS CORP·Filed 2013·Application pending·0 cites
- 3448US2015317029A1Method for detecting touch point of multi-type objectsAU OPTRONICS CORP·Filed 2015·Application pending·0 cites
- 3547US2007131988A1CMOS image sensor devices and fabrication method thereofTAIWAN SEMICONDUCTOR MFG·Filed 2005·Application pending·0 cites
- 3641US9541836B2Method and apparatus for baking photoresist patternsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Jan 10, 2017·0 cites·20 claims
- 3738US9235534B2Data protecting method, memory controller and memory storage apparatusLIN CHIN-MIN·Filed 2012·Granted Jan 12, 2016·0 cites·21 claims
- 3837US8796804B2Forming sensing elements above a semiconductor substrateLIU KE CHUN·Filed 2008·Granted Aug 5, 2014·0 cites·14 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →