Inventor · disambiguated record
Ky-Hyun Han
Also filed as: HAN KY-HYUN
18 granted patents·14 pending applications·87 citations·filing 2006–2016
92Inventor score
Top patents by PatentIndex Score
32 records- 0190US7582532B2Method for fabricating semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Sep 1, 2009·16 cites·17 claims
- 0289US7485557B2Method for fabricating semiconductor device having flask type recess gateHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Feb 3, 2009·14 cites·20 claims
- 0384US7709369B2Method for forming a roughened contact in a semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted May 4, 2010·11 cites·7 claims
- 0484US7345338B1Bulb-shaped recess gate of a semiconductor device and method for fabricating the sameHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Mar 18, 2008·9 cites·19 claims
- 0582US8198626B2Reference wafer for calibration and method for fabricating the sameLEE HYUN-CHUL·Filed 2009·Granted Jun 12, 2012·11 cites·7 claims
- 0681US9419002B2Semiconductor device for reducing coupling capacitanceSK HYNIX INC·Filed 2014·Granted Aug 16, 2016·5 cites·7 claims
- 0780US9728540B2Semiconductor device for reducing coupling capacitanceSK HYNIX INC·Filed 2016·Granted Aug 8, 2017·3 cites·10 claims
- 0875US7867911B2Method for forming pattern using hard maskHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jan 11, 2011·4 cites·9 claims
- 0974US7615494B2Method for fabricating semiconductor device including plugHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Nov 10, 2009·6 cites·20 claims
- 1072US7629242B2Method for fabricating semiconductor device having recess gateHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Dec 8, 2009·4 cites·18 claims
- 1165US7732335B2Method for forming pattern in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jun 8, 2010·2 cites·17 claims
- 1265US7585723B2Method for fabricating capacitorHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Sep 8, 2009·2 cites·26 claims
- 1348US2010295188A1Semiconductor device having deep contact structure and method of manufacturing the sameHYNIX SEMICONDUCTOR INC·Filed 2009·Application pending·0 cites
- 1445US7700455B2Method for forming isolation structure in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Apr 20, 2010·0 cites·20 claims
- 1545US7582560B2Method for fabricating semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Sep 1, 2009·0 cites·20 claims
- 1645US2008242095A1Method for forming trench in semiconductor deviceHAN KY-HYUN·Filed 2007·Application pending·0 cites
- 1745US2013240820A1Phase change random access memory and fabrication method of heating electrode for the sameSK HYNIX INC·Filed 2013·Application pending·0 cites
- 1845US2008242098A1Method for forming pattern in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Application pending·0 cites
- 1944US7741223B2Semiconductor device with bulb type recess gate and method for fabricating the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jun 22, 2010·0 cites·16 claims
- 2044US7589006B2Method for manufacturing semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Sep 15, 2009·0 cites·11 claims
- 2144US2008003832A1Method for fabricating recess gate of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Application pending·0 cites
- 2244US2007202710A1Method for fabricating semiconductor device using hard maskHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 2344US2012217219A1Reference wafer for calibration and method for fabricating the sameLEE HYUN-CHUL·Filed 2012·Application pending·0 cites
- 2443US7678535B2Method for fabricating semiconductor device with recess gateHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Mar 16, 2010·0 cites·15 claims
- 2543US2007197021A1Semiconductor device including spacer with nitride/nitride/oxide structure and method for fabricating the sameHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 2643US2007287286A1Method for fabricating semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 2743US2007128842A1Method for fabricating semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 2842US8592796B2Phase-change random access memory device and method of manufacturing the sameYOO MYOUNG SUL·Filed 2011·Granted Nov 26, 2013·0 cites·6 claims
- 2942US2008081448A1Method for fabricating semiconductor deviceLEE JUNG-SEOCK·Filed 2007·Application pending·0 cites
- 3042US2007134869A1Method for fabricating semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 3142US2009001582A1Semiconductor device with metal gate and method for fabricating the sameHYUNIX SEMICONDUCTOR INC·Filed 2007·Application pending·0 cites
- 3237US2012025162A1Phase change random access memory and method for fabricating the sameSHIN HEE SEUNG·Filed 2010·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →