Inventor · disambiguated record

Hsien-I You

Also filed as: YOU HSIEN-I

1 granted patent·2 citations·filing 2006–2006

18Inventor score

Technology areasG01L

Files withINSTR TECHNOLOGY RES CT NAT AP1

Top patents by PatentIndex Score

1 record

0140US7403270B2Method for whole field thin film stress evaluationINSTR TECHNOLOGY RES CT NAT AP·Filed 2006·Granted Jul 22, 2008·2 cites·13 claims

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