Inventor · disambiguated record
Lakshmi Kanta Bera
Also filed as: BERA LAKSHMI · BERA LAKSHMI K · BERA LAKSHMI KANTA
8 granted patents·3 pending applications·55 citations·filing 2002–2017
83Inventor score
Files withAGENCY SCIENCE TECH & RES7AGENCY FOR SCEINCE TECHNOLOGY1INST OF MICROELECTRONICS1TAN CHUNG FOONG1YU HONG YU1
Top patents by PatentIndex Score
11 records- 0184US9954088B2Semiconductor device fabricationAGENCY SCIENCE TECH & RES·Filed 2014·Granted Apr 24, 2018·9 cites·10 claims
- 0282US6716570B2Low temperature resist trimming processINST OF MICROELECTRONICS·Filed 2002·Granted Apr 6, 2004·32 cites·30 claims
- 0375US7397090B2Gate electrode architecture for improved work function tuning and method of manufactureAGENCY SCIENCE TECH & RES·Filed 2005·Granted Jul 8, 2008·7 cites·8 claims
- 0472US10679860B2Self-aligning source, drain and gate process for III-V nitride MISHEMTsAGENCY SCIENCE TECH & RES·Filed 2016·Granted Jun 9, 2020·3 cites·21 claims
- 0558US7439165B2Method of fabricating tensile strained layers and compressive strain layers for a CMOS deviceAGENCY FOR SCEINCE TECHNOLOGY·Filed 2005·Granted Oct 21, 2008·4 cites·13 claims
- 0647US9972709B2Semiconductor device fabricationAGENCY SCIENCE TECH & RES·Filed 2017·Granted May 15, 2018·0 cites·10 claims
- 0742US2010052064A1Method for straining a semiconductor wafer and a wafer substrate unit used thereinAGENCY SCIENCE TECH & RES·Filed 2006·Application pending·0 cites
- 0840US8563386B2Integrated circuit system with bandgap material and method of manufacture thereofTAN CHUNG FOONG·Filed 2010·Granted Oct 22, 2013·0 cites·20 claims
- 0939US2008135949A1Stacked silicon-germanium nanowire structure and method of forming the sameAGENCY SCIENCE TECH & RES·Filed 2006·Application pending·0 cites
- 1032US2005164460A1Salicide process for metal gate CMOS devicesAGENCY SCIENCE TECH & RES·Filed 2004·Application pending·0 cites
- 1124US7514360B2Thermal robust semiconductor device using HfN as metal gate electrode and the manufacturing process thereofYU HONG YU·Filed 2004·Granted Apr 7, 2009·0 cites·24 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →