Inventor · disambiguated record
Kazushi Yamanaka
Also filed as: YAMANAKA KAZUSHI
26 granted patents·2 pending applications·448 citations·filing 1983–2023
96Inventor score
Files withTOPPAN PRINTING CO LTD9AGENCY IND SCIENCE TECHN5BALL WAVE INC5YAMANAKA KAZUSHI2AGENCY IND SCIENCE AND SEIKO I1
Top patents by PatentIndex Score
28 records- 0195US5503010ADirectional atomic force microscope and method of observing a sample with the microscopeAGENCY IND SCIENCE TECHN·Filed 1994·Granted Apr 2, 1996·151 cites·9 claims
- 0288US6006593AMethod using cantilever to measure physical propertiesAGENCY IND SCIENCE TECHN·Filed 1996·Granted Dec 28, 1999·102 cites·7 claims
- 0386US6566787B2Elastic surface-wave deviceTOPPAN PRINTING CO LTD·Filed 2001·Granted May 20, 2003·31 cites·15 claims
- 0479US8106703B2Booster circuitNAGAI YOSHIHIRO·Filed 2010·Granted Jan 31, 2012·9 cites·16 claims
- 0579US7647814B2Environment difference detectorTOPPAN PRINTING CO LTD·Filed 2006·Granted Jan 19, 2010·10 cites·13 claims
- 0679US7170213B2Surface acoustic wave element, electric signal processing apparatus using the surface acoustic wave element, environment evaluating apparatus using the electric signal processing apparatus, and analyzing method using the surface acoustic wave elementTOPPAN PRINTING CO LTD·Filed 2004·Granted Jan 30, 2007·18 cites·19 claims
- 0773US11307176B2Standard-moisture generator, system using the standard-moisture generator, method for detecting abnormality in standard-moisture and computer program product for detecting the abnormalityBALL WAVE INC·Filed 2019·Granted Apr 19, 2022·1 cites·9 claims
- 0873US6983644B2Specimen observation method in atomic force microscopy and atomic force microscopeJEOL LTD·Filed 2002·Granted Jan 10, 2006·21 cites·13 claims
- 0971US7247969B2Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave deviceTOPPAN PRINTING CO LTD·Filed 2006·Granted Jul 24, 2007·4 cites·16 claims
- 1070US5804708AAtomic force microscope and method of analyzing frictions in atomic force microscopeAGENCY IND SCIENCE AND SEIKO I·Filed 1995·Granted Sep 8, 1998·45 cites·12 claims
- 1170US4524621AMethod for measurement of velocity of surface acoustic waveAGENCY IND SCIENCE TECHN·Filed 1983·Granted Jun 25, 1985·24 cites·5 claims
- 1267US7423360B2Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave deviceTOPPAN PRINTING CO LTD·Filed 2007·Granted Sep 9, 2008·3 cites·15 claims
- 1365US8004902B2Nonvolatile semiconductor memory deviceRENESAS ELECTRONICS CORP·Filed 2009·Granted Aug 23, 2011·6 cites·6 claims
- 1464US8220310B2Gas analyzer and method of gas analysisYAMANAKA KAZUSHI·Filed 2007·Granted Jul 17, 2012·2 cites·12 claims
- 1562US7368848B2Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave deviceTOPPAN PRINTING CO LTD·Filed 2007·Granted May 6, 2008·2 cites·14 claims
- 1661US7408285B2Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave deviceTOPPAN PRINTING CO LTD·Filed 2007·Granted Aug 5, 2008·2 cites·16 claims
- 1761US7368847B2Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave deviceTOPPAN PRINTING CO LTD·Filed 2007·Granted May 6, 2008·2 cites·12 claims
- 1861US7362034B2Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave deviceTOPPAN PRINTING CO LTD·Filed 2007·Granted Apr 22, 2008·2 cites·19 claims
- 1959US8559696B2Imaging method of structure defect, imaging device of structure defect, imaging method of bubble or lesion and imaging device of bubble or lesionYAMANAKA KAZUSHI·Filed 2009·Granted Oct 15, 2013·2 cites·19 claims
- 2056US2023236191A1Virus test device, virus test system, virus test method, and virus test programBALL WAVE INC·Filed 2023·Application pending·0 cites
- 2155US9726709B2Semiconductor chip and method for detecting disconnection of wire bonded to semiconductor chipTOYOTA MOTOR CO LTD·Filed 2016·Granted Aug 8, 2017·1 cites·8 claims
- 2250US11982659B2System, method and program for calibrating moisture sensorBALL WAVE INC·Filed 2021·Granted May 14, 2024·0 cites·5 claims
- 2349US10436757B2Electrical signal processing deviceUNIV TOHOKU·Filed 2015·Granted Oct 8, 2019·0 cites·9 claims
- 2446US11333631B2System, method and computer program product for measuring gas concentrationBALL WAVE INC·Filed 2017·Granted May 17, 2022·0 cites·20 claims
- 2544US11313836B2System, method and computer program product for gas analysisBALL WAVE INC·Filed 2019·Granted Apr 26, 2022·0 cites·19 claims
- 2642US4825423AMethod of measuring microcrack depthAGENCY IND SCIENCE TECHN·Filed 1986·Granted Apr 25, 1989·7 cites·1 claims
- 2741US2007041870A1Sensor head, gas sensor and sensor unitBALL SEMICONDUCTOR LTD·Filed 2004·Application pending·0 cites
- 2832US5101382AAcoustic imaging method and apparatus for nondestructive evaluation of materialsAGENCY IND SCIENCE TECHN·Filed 1990·Granted Mar 31, 1992·3 cites·7 claims
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