Inventor · disambiguated record
Pierre Eyben
Also filed as: EYBEN PIERRE
2 granted patents·7 citations·filing 2002–2013
50Inventor score
Top patents by PatentIndex Score
2 records- 0160US9588137B2Method for determining local resistivity and carrier concentration using scanning spreading resistance measurement set-upIMEC·Filed 2013·Granted Mar 7, 2017·1 cites·8 claims
- 0247US6823723B2Method and apparatus for performing atomic force microscopy measurementsIMEC INTER UNI MICRO ELECTR·Filed 2002·Granted Nov 30, 2004·6 cites·22 claims
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