Inventor · disambiguated record

Toshio Binnaka

Also filed as: BINNAKA TOSHIO

1 granted patent·51 citations·filing 1984–1984

49Inventor score

Technology areasG01R

Files withFUJITSU LTD1

Top patents by PatentIndex Score

1 record

0185US4604572ADevice for testing semiconductor devices at a high temperatureFUJITSU LTD·Filed 1984·Granted Aug 5, 1986·51 cites·10 claims

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