Inventor · disambiguated record
Dominik Zinner
Also filed as: ZINNER DOMINIK
8 granted patents·5 pending applications·20 citations·filing 2016–2025
81Inventor score
Files withEV GROUP E THALLNER GMBH13
Top patents by PatentIndex Score
13 records- 0195US10943807B2Method and device for alignment of substratesEV GROUP E THALLNER GMBH·Filed 2020·Granted Mar 9, 2021·7 cites·23 claims
- 0289US10692747B2Method and device for alignment of substratesEV GROUP E THALLNER GMBH·Filed 2016·Granted Jun 23, 2020·6 cites·18 claims
- 0386US2025372571A1Apparatus and method for bonding substratesEV GROUP E THALLNER GMBH·Filed 2025·Application pending·0 cites
- 0482US11315901B2Method for bonding substratesEV GROUP E THALLNER GMBH·Filed 2017·Granted Apr 26, 2022·3 cites·10 claims
- 0575US12025426B2Measuring device and method for determining the course of a bonding waveEV GROUP E THALLNER GMBH·Filed 2019·Granted Jul 2, 2024·2 cites·15 claims
- 0674US10991609B2Method and substrate holder for the controlled bonding of substratesEV GROUP E THALLNER GMBH·Filed 2016·Granted Apr 27, 2021·2 cites·16 claims
- 0772US12412865B2Apparatus and method for bonding substratesEV GROUP E THALLNER GMBH·Filed 2022·Granted Sep 9, 2025·0 cites·16 claims
- 0867US11488851B2Method and device for alignment of substratesEV GROUP E THALLNER GMBH·Filed 2021·Granted Nov 1, 2022·0 cites·21 claims
- 0948US12199062B2Device and method for the alignment of substratesEV GROUP E THALLNER GMBH·Filed 2020·Granted Jan 14, 2025·0 cites·20 claims
- 1048US2025125152A1Method and device for compensating for distortionsEV GROUP E THALLNER GMBH·Filed 2021·Application pending·0 cites
- 1146US2023369095A1Substrate holder and method for producing a substrate holder for bondingEV GROUP E THALLNER GMBH·Filed 2021·Application pending·0 cites
- 1246US2023207379A1Method and device for bonding substratesEV GROUP E THALLNER GMBH·Filed 2020·Application pending·0 cites
- 1343US2024420976A1Device and method for adjusting a detection meansEV GROUP E THALLNER GMBH·Filed 2021·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →