Inventor · disambiguated record
Kunito Hayashi
Also filed as: HAYASHI KUNITO
2 granted patents·1 citations·filing 2004–2007
29Inventor score
Top patents by PatentIndex Score
2 records- 0141US8158310B2Aberration evaluation pattern, aberration evaluation method, aberration correction method, electron beam drawing apparatus, electron microscope, master, stamper, recording medium, and structureMIYATA HIROYUKI·Filed 2007·Granted Apr 17, 2012·0 cites·5 claims
- 0239US6989536B2Electron-beam writing device and electron-beam writing methodCRESTEC CORP·Filed 2004·Granted Jan 24, 2006·1 cites·16 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →