Inventor · disambiguated record
Christian K. Forgey
Also filed as: FORGEY CHRISTIAN · FORGEY CHRISTIAN K · FORGEY II CHRISTIAN
9 granted patents·4 pending applications·27 citations·filing 1994–2021
81Inventor score
Files withOEM GROUP LLC6LIGHT BOHRD LLC2SHELLBACK SEMICONDUCTOR TECH LLC2TEXAS INSTRUMENTS INC2FORGEY CHRISTIAN1
Top patents by PatentIndex Score
13 records- 0177US10629103B2Systems and methods for luminescent displayLIGHT BOHRD LLC·Filed 2014·Granted Apr 21, 2020·7 cites·23 claims
- 0260US11623229B2Adjustable flow nozzle systemSHELLBACK SEMICONDUCTOR TECH LLC·Filed 2021·Granted Apr 11, 2023·0 cites·4 claims
- 0357US5455426ATarget chamber shieldingTEXAS INSTRUMENTS INC·Filed 1994·Granted Oct 3, 1995·14 cites·18 claims
- 0453US11071989B2Adjustable flow nozzle systemOEM GROUP LLC·Filed 2018·Granted Jul 27, 2021·0 cites·10 claims
- 0546US11664251B2Systems and methods for a spray measurement apparatusSHELLBACK SEMICONDUCTOR TECH LLC·Filed 2020·Granted May 30, 2023·0 cites·20 claims
- 0646US10777434B2Systems and methods for a spray measurement apparatusOEM GROUP LLC·Filed 2019·Granted Sep 15, 2020·0 cites·13 claims
- 0741US2011309772A1Systems and methods for luminescent displayFORGEY CHRISTIAN·Filed 2011·Application pending·0 cites
- 0839US5508519AMainshaft shieldTEXAS INSTRUMENTS INC·Filed 1994·Granted Apr 16, 1996·6 cites·13 claims
- 0937US2013214701A1Systems and methods for luminescent displayLIGHT BOHRD LLC·Filed 2013·Application pending·0 cites
- 1036US11207697B2Adjustable flow nozzle systemOEM GROUP LLC·Filed 2020·Granted Dec 28, 2021·0 cites·18 claims
- 1135US11615947B2Systems and methods for an improved magnetron electromagnetic assemblyOEM GROUP LLC·Filed 2021·Granted Mar 28, 2023·0 cites·3 claims
- 1234US2022068619A1Systems and methods for a magnetron with a segmented target configurationOEM GROUP LLC·Filed 2021·Application pending·0 cites
- 1327US2021054497A1Systems and methods for a lift and rotate wafer handling processOEM GROUP LLC·Filed 2020·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →