Inventor · disambiguated record
Jun Abe
Also filed as: ABE JUN · ABE JUN-ICHI
71 granted patents·23 pending applications·948 citations·filing 1990–2025
99Inventor score
Top patents by PatentIndex Score
94 records- 0197US10388544B2Substrate processing apparatus and substrate processing methodTOSHIBA KK·Filed 2015·Granted Aug 20, 2019·45 cites·4 claims
- 0297US9564287B2Substrate processing apparatus and substrate processing method using sameTOKYO ELECTRON LTD·Filed 2013·Granted Feb 7, 2017·41 cites·20 claims
- 0397US8703002B2Plasma processing apparatus, plasma processing method and storage mediumTOKYO ELECTRON LTD·Filed 2013·Granted Apr 22, 2014·343 cites·8 claims
- 0495US8821684B2Substrate plasma processing apparatus and plasma processing methodUI AKIO·Filed 2009·Granted Sep 2, 2014·52 cites·5 claims
- 0594US8568606B2Substrate processing apparatus and substrate processing method using sameOHSE TAKESHI·Filed 2010·Granted Oct 29, 2013·37 cites·18 claims
- 0689US12123543B2Inclination sensor and data acquisition deviceTOPCON CORP·Filed 2022·Granted Oct 22, 2024·2 cites·8 claims
- 0789US7752869B2Optical fiber preform, method for manufacturing thereof, and optical fiber obtained by drawing thereofSHINETSU CHEMICAL CO·Filed 2005·Granted Jul 13, 2010·9 cites·11 claims
- 0888US8331832B2Developing device, assembly body, and image forming apparatusIKEDA MIHO·Filed 2010·Granted Dec 11, 2012·6 cites·20 claims
- 0987US11251048B2Plasma processing method and plasma processing apparatusTOKYO ELECTRON LTD·Filed 2020·Granted Feb 15, 2022·2 cites·19 claims
- 1086US9500537B2Temperature measurement apparatus and methodTOKYO ELECTRON LTD·Filed 2016·Granted Nov 22, 2016·2 cites·1 claims
- 1186US6497992B1Process for manufacturing semiconductor integrated circuit deviceHITACHI LTD·Filed 2000·Granted Dec 24, 2002·32 cites·7 claims
- 1285US12205801B2Plasma processing apparatus and plasma processing methodTOKYO ELECTRON LTD·Filed 2021·Granted Jan 21, 2025·2 cites·7 claims
- 1385US8676097B2Developing device, assembly, and image forming apparatus with a biasing memberFUJI XEROX CO LTD·Filed 2013·Granted Mar 18, 2014·3 cites·6 claims
- 1484US8151406B2Wiper bladeMACHIDA KEN·Filed 2005·Granted Apr 10, 2012·22 cites·6 claims
- 1583US8852387B2Plasma processing apparatus and shower headIIZUKA HACHISHIRO·Filed 2011·Granted Oct 7, 2014·6 cites·8 claims
- 1682US6564585B2Method for producing a second-order nonlinear glass materialSHINETSU CHEMICAL CO·Filed 2001·Granted May 20, 2003·18 cites·4 claims
- 1779US6057081AProcess for manufacturing semiconductor integrated circuit deviceHITACHI LTD·Filed 1997·Granted May 2, 2000·50 cites·60 claims
- 1878US8852386B2Plasma processing apparatusIIZUKA HACHISHIRO·Filed 2010·Granted Oct 7, 2014·5 cites·5 claims
- 1977USD568801SWindshield wiperMITSUBA CORP·Filed 2007·Granted May 13, 2008·19 cites·1 claims
- 2075US8747609B2Plasma processing apparatus and shower headIIZUKA HACHISHIRO·Filed 2010·Granted Jun 10, 2014·4 cites·8 claims
- 2175US5712941ARare earth element-doped multiple-core optical fiber and method for fabricating the sameHITACHI CABLE·Filed 1996·Granted Jan 27, 1998·42 cites·15 claims
- 2273US8660470B2Developing device and image forming apparatus including the sameWATANABE YOICHI·Filed 2012·Granted Feb 25, 2014·2 cites·6 claims
- 2373USD571705SWindshield wiperMITSUBA CORP·Filed 2005·Granted Jun 24, 2008·17 cites·1 claims
- 2469US8182142B2Temperature measuring apparatus and temperature measuring methodABE JUN·Filed 2008·Granted May 22, 2012·4 cites·5 claims
- 2569US5887233APhotographic developing apparatus and electrifying apparatusFUJI XEROX CO LTD·Filed 1997·Granted Mar 23, 1999·19 cites·36 claims
- 2668US8585284B2Temperature measurement apparatus and methodABE JUN·Filed 2012·Granted Nov 19, 2013·1 cites·4 claims
- 2767US8986494B2Plasma processing apparatus and temperature measuring method and apparatus used thereinMATSUDO TATSUO·Filed 2010·Granted Mar 24, 2015·2 cites·9 claims
- 2867US7952717B2Temperature measuring apparatus and temperature measuring methodTOKYO ELECTRON LTD·Filed 2008·Granted May 31, 2011·6 cites·7 claims
- 2967US5247333AOne-component developing apparatusFUJI XEROX CO LTD·Filed 1992·Granted Sep 21, 1993·17 cites·14 claims
- 3065US12261027B2Plasma processing apparatus and plasma processing methodTOKYO ELECTRON LTD·Filed 2022·Granted Mar 25, 2025·0 cites·19 claims
- 3165US7276150B2Method of desulfurizing gas oil fraction, desulfurized gas oil, and desulfurizer for gas oil fractionJGC CORP·Filed 2001·Granted Oct 2, 2007·11 cites·6 claims
- 3264US6681074B1Method for producing base material for optical fiber having deformed first clad, base material for optical fiber and optical fiberSHINETSU CHEMICAL CO·Filed 2000·Granted Jan 20, 2004·3 cites·3 claims
- 3363US8745811B2Connection member in wiper bladeFUJIWARA MASARU·Filed 2007·Granted Jun 10, 2014·3 cites·9 claims
- 3462US8641117B2Assist grip for vehicleABE JUN·Filed 2012·Granted Feb 4, 2014·4 cites·20 claims
- 3562US6600857B1Grating optical fiber, and optical fiber base material suitable for gratingSHINETSU CHEMICAL CO·Filed 2000·Granted Jul 29, 2003·3 cites·5 claims
- 3661US8708386B2Assist grip for vehicleABE JUN·Filed 2012·Granted Apr 29, 2014·3 cites·11 claims
- 3761US6157758AGrating optical fiber, and optical fiber base material suitable for gratingSHINETSU CHEMICAL CO·Filed 1999·Granted Dec 5, 2000·13 cites·10 claims
- 3860US11814748B2Method for producing lithium tantalate single crystal substrateSHINETSU CHEMICAL CO·Filed 2021·Granted Nov 14, 2023·0 cites·9 claims
- 3958US5513038AAntireflective film and optical elements having the sameNIKON CORP·Filed 1993·Granted Apr 30, 1996·18 cites·14 claims
- 4057US9304050B2Temperature measurement apparatus and methodTOKYO ELECTRON LTD·Filed 2013·Granted Apr 5, 2016·0 cites·2 claims
- 4157US5706124ARare earth element-doped optical fiber amplifierHITACHI CABLE·Filed 1996·Granted Jan 6, 1998·20 cites·6 claims
- 4257US2022244381A1Electro-optical distance meter and distance calculation methodTOPCON CORP·Filed 2022·Application pending·0 cites
- 4357US2023015894A1Light wave distance meterTOPCON CORP·Filed 2022·Application pending·0 cites
- 4457US2022283277A1Electro-optical distance meter and method for calculating optical noise signalTOPCON CORP·Filed 2022·Application pending·0 cites
- 4556US2014286375A1Temperature measuring apparatus and temperature measuring methodTOKYO ELECTRON LTD·Filed 2014·Application pending·0 cites
- 4655US11021810B2Lithium tantalate single crystal substrate, bonded substrate, manufacturing method of the bonded substrate, and surface acoustic wave device using the bonded substrateSHINETSU CHEMICAL CO·Filed 2016·Granted Jun 1, 2021·0 cites·14 claims
- 4755US8144332B2Temperature measurement apparatus and methodABE JUN·Filed 2009·Granted Mar 27, 2012·1 cites·8 claims
- 4855US6380109B1Second-order nonlinear glass materialSHINETSU CHEMICAL CO·Filed 2000·Granted Apr 30, 2002·2 cites·6 claims
- 4954US2010072172A1Substrate processing apparatus and substrate processing methodUI AKIO·Filed 2009·Application pending·0 cites
- 5053US9554172B2Rebroadcasting systemHITACHI INT ELECTRIC INC·Filed 2014·Granted Jan 24, 2017·0 cites·6 claims
Showing the top 50 of 94 patent records by PatentIndex Score.
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