Inventor · disambiguated record
Casey Kurth
Also filed as: KURTH CASEY · KURTH CASEY R
62 granted patents·14 pending applications·938 citations·filing 1995–2025
99Inventor score
Top patents by PatentIndex Score
76 records- 0196US9269858B2Engineered substrates for semiconductor devices and associated systems and methodsSCHUBERT MARTIN F·Filed 2011·Granted Feb 23, 2016·23 cites·11 claims
- 0294US6545899B1ROM embedded DRAM with bias sensingMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 8, 2003·53 cites·24 claims
- 0394US6243285B1ROM-embedded-DRAMMICRON TECHNOLOGY INC·Filed 2000·Granted Jun 5, 2001·52 cites·10 claims
- 0492US10062677B2Back-to-back solid state lighting devices and associated methodsMICRON TECHNOLOGY INC·Filed 2016·Granted Aug 28, 2018·6 cites·13 claims
- 0592US6781867B2Embedded ROM device using substrate leakageMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 24, 2004·44 cites·11 claims
- 0691US9443834B2Back-to-back solid state lighting devices and associated methodsBASCERI CEM·Filed 2010·Granted Sep 13, 2016·9 cites·23 claims
- 0791US5627478AApparatus for disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 1995·Granted May 6, 1997·59 cites·14 claims
- 0889US6834022B2Partial array self-refreshMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 21, 2004·42 cites·37 claims
- 0989US6134137ARom-embedded-DRAMMICRON TECHNOLOGY INC·Filed 1998·Granted Oct 17, 2000·54 cites·14 claims
- 1088US11037918B2Back-to-back solid state lighting devices and associated methodsMICRON TECHNOLOGY INC·Filed 2018·Granted Jun 15, 2021·3 cites·13 claims
- 1187US6130834ACircuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 10, 2000·53 cites·24 claims
- 1286US6281131B1Methods of forming electrical contactsMICRON TECHNOLOGY INC·Filed 1998·Granted Aug 28, 2001·63 cites·51 claims
- 1384US12191298B2Back-to-back solid state lighting devices and associated methodsMICRON TECHNOLOGY INC·Filed 2023·Granted Jan 7, 2025·0 cites·20 claims
- 1484US6255837B1Apparatus and method disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 3, 2001·18 cites·4 claims
- 1582US7366946B2ROM redundancy in ROM embedded DRAMMICRON TECHNOLOGY INC·Filed 2007·Granted Apr 29, 2008·11 cites·21 claims
- 1679US5732033AMethod and circuit for rapidly equilibrating paired digit lines of a memory device during testingMICRON TECHNOLOGY INC·Filed 1996·Granted Mar 24, 1998·34 cites·17 claims
- 1779US2025140774A1Back-to-back solid state lighting devices and associated methodsMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1878US7440255B2Capacitor constructions and methods of formingMICRON TECHNOLOGY INC·Filed 2003·Granted Oct 21, 2008·20 cites·56 claims
- 1977US9620670B2Solid state lighting dies with quantum emitters and associated methods of manufacturingBASCERI CEM·Filed 2010·Granted Apr 11, 2017·3 cites·3 claims
- 2077US6410385B2ROM-embedded-DRAMMICRON TECHNOLOGY INC·Filed 2001·Granted Jun 25, 2002·13 cites·16 claims
- 2176US11710732B2Back-to-back solid state lighting devices and associated methodsMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 25, 2023·0 cites·20 claims
- 2276US6785167B2ROM embedded DRAM with programmingMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 31, 2004·22 cites·37 claims
- 2376US6570400B2Method for disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 2002·Granted May 27, 2003·11 cites·11 claims
- 2476US5689455ACircuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 1995·Granted Nov 18, 1997·29 cites·7 claims
- 2572US9293678B2Solid-state light emitters having substrates with thermal and electrical conductivity enhancements and method of manufactureSCHELLHAMMER SCOTT D·Filed 2010·Granted Mar 22, 2016·3 cites·14 claims
- 2672US6665207B2ROM embedded DRAM with dielectric removal/shortMICRON TECHNOLOGY INC·Filed 2001·Granted Dec 16, 2003·14 cites·10 claims
- 2771US6255838B1Apparatus and method for disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 3, 2001·9 cites·7 claims
- 2870US6735108B2ROM embedded DRAM with anti-fuse programmingMICRON TECHNOLOGY INC·Filed 2002·Granted May 11, 2004·14 cites·20 claims
- 2970US6650587B2Partial array self-refreshMICRON TECHNOLOGY INC·Filed 2001·Granted Nov 18, 2003·14 cites·49 claims
- 3070US6192446B1Memory device with command bufferMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 20, 2001·24 cites·27 claims
- 3169US6996021B2ROM embedded DRAM with bias sensingMICRON TECHNOLOGY INC·Filed 2004·Granted Feb 7, 2006·9 cites·10 claims
- 3269US6826071B2Circuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 2002·Granted Nov 30, 2004·14 cites·14 claims
- 3369US6385691B2Memory device with command buffer that allows internal command buffer jumpsMICRON TECHNOLOGY INC·Filed 2001·Granted May 7, 2002·14 cites·19 claims
- 3468US6903991B2Circuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 7, 2005·12 cites·7 claims
- 3567US6724238B2Antifuse circuit with improved gate oxide reliabilityMICRON TECHNOLOGY INC·Filed 2003·Granted Apr 20, 2004·12 cites·7 claims
- 3667US6055173ACircuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 25, 2000·19 cites·8 claims
- 3766US6445605B1Circuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 3, 2002·13 cites·11 claims
- 3865US7218547B2ROM embedded DRAM with anti-fuse programmingMICRON TECHNOLOGY INC·Filed 2004·Granted May 15, 2007·11 cites·25 claims
- 3965US7174477B2ROM redundancy in ROM embedded DRAMMICRON TECHNOLOGY INC·Filed 2003·Granted Feb 6, 2007·11 cites·27 claims
- 4065US6590407B2Apparatus for disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 8, 2003·6 cites·5 claims
- 4165US2025212476A1Method and system for planarization of engineered substratesQROMIS INC·Filed 2024·Application pending·0 cites
- 4265US2025210348A1Engineered substrate with a multi-barrier layer structureQROMIS INC·Filed 2024·Application pending·0 cites
- 4364US6646459B2Method for disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 2001·Granted Nov 11, 2003·6 cites·4 claims
- 4464US2025212477A1Method and system for multi-core engineered substrateQROMIS INC·Filed 2024·Application pending·0 cites
- 4563US6137737AMethod and circuit for rapidly equilibrating paired digit lines of a memory device during testingMICRON TECHNOLOGY INC·Filed 1997·Granted Oct 24, 2000·16 cites·16 claims
- 4663US5721703AReprogrammable option select circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Feb 24, 1998·22 cites·1 claims
- 4759US6747889B2Half density ROM embedded DRAMMICRON TECHNOLOGY INC·Filed 2001·Granted Jun 8, 2004·8 cites·16 claims
- 4859US6160413AApparatus and method for disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 1998·Granted Dec 12, 2000·12 cites·7 claims
- 4957US6661693B2Circuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 2002·Granted Dec 9, 2003·7 cites·8 claims
- 5056US6731556B2DRAM with bias sensingMICRON TECHNOLOGY INC·Filed 2003·Granted May 4, 2004·7 cites·38 claims
Showing the top 50 of 76 patent records by PatentIndex Score.
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