Inventor · disambiguated record
Hendricus Joseph Maria Veendrick
Also filed as: VEENDRICK HENDRICUS J M · VEENDRICK HENDRICUS JOSEPH · VEENDRICK HENDRICUS JOSEPH MAR · VEENDRICK HENDRICUS JOSEPH MARIA
13 granted patents·2 pending applications·48 citations·filing 2002–2009
88Inventor score
Files withNXP BV8KONINKL PHILIPS ELECTRONICS NV3VEENDRICK HENDRICUS JOSEPH MARIA2PELGROM MARCEL J M1VEENDRICK HENDRICUS J M1
Top patents by PatentIndex Score
15 records- 0166US6914468B2Controllable delay circuit for delaying an electrical signalKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Jul 5, 2005·15 cites·9 claims
- 0264US7102254B2Integrated circuit and battery powered electronic deviceKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Sep 5, 2006·12 cites·4 claims
- 0360US8390331B2Flexible CMOS library architecture for leakage power and variability reductionVEENDRICK HENDRICUS JOSEPH MARIA·Filed 2009·Granted Mar 5, 2013·3 cites·20 claims
- 0457US8022752B2Voltage reference circuit for low supply voltagesNXP BV·Filed 2009·Granted Sep 20, 2011·4 cites·17 claims
- 0554US8203368B2DLL for period jitter measurementPELGROM MARCEL J M·Filed 2009·Granted Jun 19, 2012·3 cites·8 claims
- 0652US7710136B2Intergrated circuit self-test architectureNXP BV·Filed 2005·Granted May 4, 2010·2 cites·6 claims
- 0752US7212034B2Current mode signaling in electronic data processing circuitKONINKL PHILIPS ELECTRONICS NV·Filed 2003·Granted May 1, 2007·2 cites·6 claims
- 0850US7439759B2Operating long on-chip busesNXP BV·Filed 2004·Granted Oct 21, 2008·1 cites·16 claims
- 0944US7478302B2Signal integrity self-test architectureNXP BV·Filed 2004·Granted Jan 13, 2009·4 cites·39 claims
- 1043US8139401B2Integrated circuit with a memory matrix with a delay monitoring columnVEENDRICK HENDRICUS J M·Filed 2009·Granted Mar 20, 2012·1 cites·10 claims
- 1141US8874394B2Simple and stable reference for IR-drop and supply noise measurementsVEENDRICK HENDRICUS JOSEPH MARIA·Filed 2009·Granted Oct 28, 2014·0 cites·14 claims
- 1241US7791357B2On silicon interconnect capacitance extractionNXP BV·Filed 2005·Granted Sep 7, 2010·1 cites·14 claims
- 1341US2011140730A1Detection circuitry for detecting bonding conditions on bond padsNXP BV·Filed 2009·Application pending·0 cites
- 1439US2010308329A1Lithography robustness monitorNXP BV·Filed 2009·Application pending·0 cites
- 1533US7928882B2Monitoring physical operating parameters of an integrated circuitNXP BV·Filed 2005·Granted Apr 19, 2011·0 cites·16 claims
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