Inventor · disambiguated record
David R. Cuthbert
Also filed as: CUTHBERT DAVID · CUTHBERT DAVID R
27 granted patents·2 pending applications·281 citations·filing 1999–2008
97Inventor score
Top patents by PatentIndex Score
29 records- 0192US6563299B1Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2000·Granted May 13, 2003·48 cites·2 claims
- 0289US7705677B2CMOS amplifiers with frequency compensating capacitorsMICRON TECHNOLOGY INC·Filed 2008·Granted Apr 27, 2010·12 cites·14 claims
- 0389US7236415B2Sample and hold memory sense amplifierMICRON TECHNOLOGY INC·Filed 2004·Granted Jun 26, 2007·42 cites·44 claims
- 0489US6526519B1Method and apparatus for reducing signal timing skew on a printed circuit boardMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 25, 2003·60 cites·47 claims
- 0587US7180370B2CMOS amplifiers with frequency compensating capacitorsMICRON TECHNOLOGY INC·Filed 2004·Granted Feb 20, 2007·26 cites·21 claims
- 0685US7453751B2Sample and hold memory sense amplifierMICRON TECHNOLOGY INC·Filed 2006·Granted Nov 18, 2008·14 cites·23 claims
- 0781US7230479B2Technique to improve the gain and signal to noise ratio in CMOS switched capacitor amplifiersMICRON TECHNOLOGY INC·Filed 2005·Granted Jun 12, 2007·9 cites·24 claims
- 0879US7119563B2Integrated circuit characterization printed circuit boardMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 10, 2006·7 cites·7 claims
- 0978US7498875B2Technique to improve the gain and signal to noise ratio in CMOS switched capacitor amplifiersMICRON TECHNOLOGY INC·Filed 2007·Granted Mar 3, 2009·7 cites·25 claims
- 1074US7339431B2CMOS amplifiers with frequency compensating capacitorsMICRON TECHNOLOGY INC·Filed 2007·Granted Mar 4, 2008·5 cites·13 claims
- 1170US7295081B2Time delay oscillator for integrated circuitsMICRON TECHNOLOGY INC·Filed 2005·Granted Nov 13, 2007·5 cites·30 claims
- 1269US7208959B2Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2005·Granted Apr 24, 2007·2 cites·18 claims
- 1369US7202739B2CMOS amplifiers with frequency compensating capacitorsMICRON TECHNOLOGY INC·Filed 2006·Granted Apr 10, 2007·4 cites·7 claims
- 1467US6924637B2Integrated circuit characterization printed circuit board, test equipment including same, method of fabrication thereof and method of characterizing an integrated circuit deviceMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 2, 2005·10 cites·10 claims
- 1567US6675313B2Method and apparatus for reducing signal timing skew on a printed circuit boardMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 6, 2004·10 cites·19 claims
- 1658US7417505B2CMOS amplifiers with frequency compensating capacitorsMICRON TECHNOLOGY INC·Filed 2006·Granted Aug 26, 2008·2 cites·20 claims
- 1758US7145323B2Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2004·Granted Dec 5, 2006·4 cites·4 claims
- 1858US6822438B2Apparatus for measuring parasitic capacitance and inductance of I/O leads on electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2003·Granted Nov 23, 2004·4 cites·2 claims
- 1957US7629858B2Time delay oscillator for integrated circuitsMICRON TECHNOLOGY INC·Filed 2007·Granted Dec 8, 2009·2 cites·24 claims
- 2056US7339423B2Technique to improve the gain and signal to noise ratio in CMOS switched capacitor amplifiersMICRON TECHNOLOGY INC·Filed 2007·Granted Mar 4, 2008·2 cites·17 claims
- 2151US7294790B2Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2003·Granted Nov 13, 2007·2 cites·7 claims
- 2251US7239152B2Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2004·Granted Jul 3, 2007·2 cites·4 claims
- 2351US7212013B2Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2005·Granted May 1, 2007·0 cites·22 claims
- 2451US7199593B2Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2005·Granted Apr 3, 2007·0 cites·22 claims
- 2545US2006268140A1Method and apparatus for reducing noise in analog amplifier circuits and solid state imagers employing such circuitsMICRON TECHNOLOGY INC·Filed 2005·Application pending·0 cites
- 2642US7208935B2Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2003·Granted Apr 24, 2007·0 cites·8 claims
- 2742US6967629B2Low profile antennaMICRON TECHNOLOGY INC·Filed 2004·Granted Nov 22, 2005·2 cites·23 claims
- 2840US7271581B2Integrated circuit characterization printed circuit board, test equipment including same, method of fabrication thereof and method of characterizing an integrated circuit deviceMICRON TECHNOLOGY INC·Filed 2003·Granted Sep 18, 2007·0 cites·23 claims
- 2932US2007054550A1Multi-device power charger and data communication deviceCUTHBERT DAVID·Filed 2006·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →