Inventor · disambiguated record
Richard N. Hedden
Also filed as: HEDDEN RICHARD N
12 granted patents·96 citations·filing 2000–2019
90Inventor score
Files withMICRON TECHNOLOGY INC12
Top patents by PatentIndex Score
12 records- 0196US9741421B1Refresh circuitryMICRON TECHNOLOGY INC·Filed 2016·Granted Aug 22, 2017·31 cites·23 claims
- 0292US6563299B1Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2000·Granted May 13, 2003·48 cites·2 claims
- 0371US10304515B2Refresh circuitryMICRON TECHNOLOGY INC·Filed 2017·Granted May 28, 2019·2 cites·18 claims
- 0469US7208959B2Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2005·Granted Apr 24, 2007·2 cites·18 claims
- 0563US11276450B2Refresh circuitryMICRON TECHNOLOGY INC·Filed 2019·Granted Mar 15, 2022·1 cites·8 claims
- 0658US7145323B2Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2004·Granted Dec 5, 2006·4 cites·4 claims
- 0758US6822438B2Apparatus for measuring parasitic capacitance and inductance of I/O leads on electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2003·Granted Nov 23, 2004·4 cites·2 claims
- 0851US7294790B2Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2003·Granted Nov 13, 2007·2 cites·7 claims
- 0951US7239152B2Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2004·Granted Jul 3, 2007·2 cites·4 claims
- 1051US7212013B2Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2005·Granted May 1, 2007·0 cites·22 claims
- 1151US7199593B2Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2005·Granted Apr 3, 2007·0 cites·22 claims
- 1242US7208935B2Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzerMICRON TECHNOLOGY INC·Filed 2003·Granted Apr 24, 2007·0 cites·8 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →