Inventor · disambiguated record
Noriyoshi Kozuka
Also filed as: KOZUKA NORIYOSHI
3 granted patents·1 pending application·48 citations·filing 1999–2011
64Inventor score
Top patents by PatentIndex Score
4 records- 0173US6417682B1Semiconductor device testing apparatus and its calibration methodADVANTEST CORP·Filed 1999·Granted Jul 9, 2002·46 cites·42 claims
- 0254US8516430B2Test apparatus and circuit apparatusKOZUKA NORIYOSHI·Filed 2010·Granted Aug 20, 2013·2 cites·16 claims
- 0331US8014969B2Test apparatus, test method and manufacturing methodADVANTEST CORP·Filed 2007·Granted Sep 6, 2011·0 cites·9 claims
- 0427US2012062256A1Test apparatus, calibration method and recording mediumKOZUKA NORIYOSHI·Filed 2011·Application pending·0 cites
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