Inventor · disambiguated record
Leonard O. Farnsworth, Iii
Also filed as: FARNSWORTH III LEONARD O
4 granted patents·20 citations·filing 2001–2008
73Inventor score
Top patents by PatentIndex Score
4 records- 0166US7305600B2Partial good integrated circuit and method of testing sameIBM·Filed 2003·Granted Dec 4, 2007·11 cites·19 claims
- 0256US7478301B2Partial good integrated circuit and method of testing sameIBM·Filed 2008·Granted Jan 13, 2009·2 cites·9 claims
- 0354US7434129B2Partial good integrated circuit and method of testing sameIBM·Filed 2007·Granted Oct 7, 2008·3 cites·11 claims
- 0446US7103816B2Method and system for reducing test data volume in the testing of logic productsCADENCE DESIGN SYSTEMS INC·Filed 2001·Granted Sep 5, 2006·4 cites·6 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →