Inventor · disambiguated record
Takuya Lee
Also filed as: LEE TAKUYA
2 granted patents·1 pending application·0 citations·filing 2018–2018
21Inventor score
Files withRENESAS ELECTRONICS CORP3
Top patents by PatentIndex Score
3 records- 0140US10664370B2Multiple core analysis mode for defect analysisRENESAS ELECTRONICS CORP·Filed 2018·Granted May 26, 2020·0 cites·12 claims
- 0239US10656201B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2018·Granted May 19, 2020·0 cites·15 claims
- 0337US2018364297A1Semiconductor device and method of testing semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2018·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →