Inventor · disambiguated record
Lilung Lai
Also filed as: LAI LILUNG
3 granted patents·2 citations·filing 2014–2016
53Inventor score
Top patents by PatentIndex Score
3 records- 0170US9557348B2Semiconductor testing structures and fabrication method thereofSEMICONDUCTOR MFG INT BEIJING CORP·Filed 2014·Granted Jan 31, 2017·2 cites·16 claims
- 0250US9823271B2Semiconductor testing structures and semiconductor testing apparatusSEMICONDUCTOR MFG INTERNATIONAL (BEIJING) CORPORATION·Filed 2016·Granted Nov 21, 2017·0 cites·20 claims
- 0340US9606173B2In-chip static-current device failure detecting methods and apparatusSEMICONDUCTOR MFG INT BEIJING CORP·Filed 2015·Granted Mar 28, 2017·0 cites·20 claims
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