Inventor · disambiguated record
Chien-Yao Hung
Also filed as: HUNG CHIEN-YAO
8 granted patents·9 citations·filing 2009–2016
78Inventor score
Top patents by PatentIndex Score
8 records- 0182US9423423B2Probe card for testing wafersHERMES-EPITEK CORP·Filed 2013·Granted Aug 23, 2016·5 cites·3 claims
- 0262US9279853B2Test probe card structureHERMES EPITEK CORP·Filed 2014·Granted Mar 8, 2016·1 cites·21 claims
- 0361US10247756B2Probe card structureHERMES EPITEK CORP·Filed 2016·Granted Apr 2, 2019·1 cites·5 claims
- 0454US9970961B2Probe card for testing wafers with fine pitch circuitHERMES EPITEK CORP·Filed 2016·Granted May 15, 2018·0 cites·10 claims
- 0554US8829936B2Probe card structure adaptable to different test apparatuses of different specificationsHUNG CHIEN-YAO·Filed 2011·Granted Sep 9, 2014·1 cites·34 claims
- 0647US8358146B2CMOS image sensor test probe cardHERMES TESTING SOLUTIONS INC·Filed 2009·Granted Jan 22, 2013·1 cites·6 claims
- 0741US9408293B2Printed circuit board structureHERMES-EPITEK CORP·Filed 2015·Granted Aug 2, 2016·0 cites·10 claims
- 0835US9521750B2Printed circuit board of probe cardHERMES-EPITEK CORP·Filed 2015·Granted Dec 13, 2016·0 cites·8 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →