Inventor · disambiguated record
Takahiro Tani
Also filed as: TANI TAKAHIRO
15 granted patents·189 citations·filing 1990–2019
92Inventor score
Top patents by PatentIndex Score
15 records- 0166US5202841ALayout pattern verification systemMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Apr 13, 1993·49 cites·11 claims
- 0264US10707389B2Light emitting deviceNICHIA CORP·Filed 2019·Granted Jul 7, 2020·0 cites·14 claims
- 0363US6813598B1Logic simulation method and logic simulation apparatusRENESAS TECH CORP·Filed 2000·Granted Nov 2, 2004·10 cites·6 claims
- 0463US5345401ALogic circuit simulator for verifying circuit operations having MOS transistorsMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Sep 6, 1994·42 cites·16 claims
- 0558US5471409ALogic simulation apparatus and circuit simulation apparatusMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Nov 28, 1995·34 cites·8 claims
- 0655US10224468B2Method of manufacturing light emitting deviceNICHIA CORP·Filed 2018·Granted Mar 5, 2019·0 cites·5 claims
- 0751US9917234B2Method of manufacturing light emitting deviceNICHIA CORP·Filed 2016·Granted Mar 13, 2018·0 cites·14 claims
- 0845US5396615ASystem for simulating electrical delay characteristics of logic circuitsMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Mar 7, 1995·18 cites·8 claims
- 0944US9190585B2Light emitting device and lighting equipmentNICHIA CORP·Filed 2013·Granted Nov 17, 2015·0 cites·20 claims
- 1042US5677856ASimulation apparatus for circuit verificationMITSUBISHI ELEC SEMICONDUCTOR·Filed 1995·Granted Oct 14, 1997·16 cites·15 claims
- 1138US9368675B2Method of manufacturing light-emitting device and wiring substrate for light-emitting elementNICHIA CORP·Filed 2015·Granted Jun 14, 2016·0 cites·13 claims
- 1237US5931963AFault simulation apparatusMITSUBISHI ELEC SEMICONDUCTOR·Filed 1997·Granted Aug 3, 1999·7 cites·12 claims
- 1332US5701254ASwitch level simulation systemMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Dec 23, 1997·5 cites·16 claims
- 1430US5706223ALogic simulator and logic simulation methodMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Jan 6, 1998·3 cites·16 claims
- 1524US5828673ALogical check apparatus and method for semiconductor circuits and storage medium storing logical check program for semiconductor circuitsMITSUBISHI ELEC SEMICONDUCTOR·Filed 1996·Granted Oct 27, 1998·5 cites·18 claims
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