Inventor · disambiguated record

Kunihiko Shiozawa

Also filed as: SHIOZAWA KUNIHIKO

2 granted patents·16 citations·filing 1986–2000

56Inventor score

Technology areasG03F G06T

Files withFUJITSU LTD2

Top patents by PatentIndex Score

2 records

0142US6598185B1Pattern data inspection method and storage mediumFUJITSU LTD·Filed 2000·Granted Jul 22, 2003·2 cites·8 claims
0240US4774461ASystem for inspecting exposure pattern data of semiconductor integrated circuit deviceFUJITSU LTD·Filed 1986·Granted Sep 27, 1988·14 cites·22 claims

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