Inventor · disambiguated record
Dov Furman
Also filed as: FURMAN DOV
23 granted patents·5 pending applications·264 citations·filing 2001–2019
96Inventor score
Files withNEGEVTECH LTD9APPLIED MATERIALS SOUTH EAST A6APPLIED MATERIALS SEA PTE LTD3RD SYNERGY LTD3ARISE GLOBAL PTE LTD2
Top patents by PatentIndex Score
28 records- 0193US7633041B2Apparatus for determining optimum position of focus of an imaging systemAPPLIED MATERIALS SOUTH EAST A·Filed 2006·Granted Dec 15, 2009·20 cites·10 claims
- 0292US7714998B2Image splitting in optical inspection systemsAPPLIED MATERIALS SOUTH EAST A·Filed 2007·Granted May 11, 2010·34 cites·22 claims
- 0392US7274444B2Multi mode inspection method and apparatusNEGEVTECH LTD·Filed 2005·Granted Sep 25, 2007·17 cites·32 claims
- 0491US7961763B2System for detection of wafer defectsAPPLIED MATERIALS SEA PTE LTD·Filed 2006·Granted Jun 14, 2011·14 cites·6 claims
- 0591US7719674B2Image splitting in optical inspection systemsAPPLIED MATERIALS SOUTH EAST A·Filed 2007·Granted May 18, 2010·29 cites·16 claims
- 0689US7843558B2Optical inspection tools featuring light shaping diffusersAPPLIED MATERIALS SEA PTE LTD·Filed 2008·Granted Nov 30, 2010·14 cites·14 claims
- 0788US7659973B2Wafer inspection using short-pulsed continuous broadband illuminationAPPLIED MATERIALS SOUTHEAST AS·Filed 2007·Granted Feb 9, 2010·18 cites·27 claims
- 0887US6892013B2Fiber optical illumination systemNEGEVTECH LTD·Filed 2003·Granted May 10, 2005·32 cites·14 claims
- 0986US7804993B2Method and apparatus for detecting defects in wafers including alignment of the wafer images so as to induce the same smear in all imagesAPPLIED MATERIALS SOUTH EAST A·Filed 2005·Granted Sep 28, 2010·15 cites·8 claims
- 1085US7843559B2System for detection of wafer defectsAPPLIED MATERIALS SEA PTE LTD·Filed 2006·Granted Nov 30, 2010·7 cites·16 claims
- 1181US7477383B2System for detection of wafer defectsNEGEVTECH LTD·Filed 2006·Granted Jan 13, 2009·5 cites·15 claims
- 1276US7525659B2System for detection of water defectsNEGEVTECH LTD·Filed 2003·Granted Apr 28, 2009·13 cites·3 claims
- 1375US7826049B2Inspection tools supporting multiple operating states for multiple detector arrangementsAPPLIED MATERIALS SOUTH EAST A·Filed 2008·Granted Nov 2, 2010·4 cites·27 claims
- 1475US7260298B2Fiber optical illumination systemNEGEVTECH LTD·Filed 2005·Granted Aug 21, 2007·6 cites·11 claims
- 1569US11892292B2Methods and systems of holographic interferometryRD SYNERGY LTD·Filed 2018·Granted Feb 6, 2024·1 cites·14 claims
- 1668US10725428B2Methods and systems of holographic interferometryRD SYNERGY LTD·Filed 2017·Granted Jul 28, 2020·1 cites·14 claims
- 1766US7486861B2Fiber optical illumination systemNEGEVTECH LTD·Filed 2007·Granted Feb 3, 2009·1 cites·17 claims
- 1862US9958417B2Non-traversing tube inspection systemARISE GLOBAL PTE LTD·Filed 2013·Granted May 1, 2018·1 cites·13 claims
- 1961US7804590B2Multi mode inspection method and apparatusAPPLIED MATERIALS SOUTH EAST A·Filed 2008·Granted Sep 28, 2010·0 cites·12 claims
- 2060US7678049B2Bone age assessment using ultrasoundBEAM MED LTD·Filed 2001·Granted Mar 16, 2010·31 cites·45 claims
- 2158US7480039B2Multi mode inspection method and apparatusNEGEVTECH LTD·Filed 2007·Granted Jan 20, 2009·0 cites·12 claims
- 2257US11719531B2Methods and systems of holographic interferometryRD SYNERGY LTD·Filed 2019·Granted Aug 8, 2023·0 cites·15 claims
- 2357US8960007B2Handheld probe for tube inspection using APRFURMAN DOV·Filed 2012·Granted Feb 24, 2015·1 cites·9 claims
- 2455US2009225307A1Wafer inspection using short-pulsed continuous broadband illuminationNEGEVTECH LTD·Filed 2009·Application pending·0 cites
- 2541US2008037933A1Speckle reduction using a fiber bundle and light guideNEGEVTECH LTD·Filed 2006·Application pending·0 cites
- 2637US2017010179A1Adjustable wide bandwidth guidedwave (gw) probe for tube and pipe inspection systemCONFORTI EYAL·Filed 2016·Application pending·0 cites
- 2735US2018164255A1Adjustable wide bandwidth guidewave (gw) probe for tube and pipe inspection systemsARISE GLOBAL PTE LTD·Filed 2016·Application pending·0 cites
- 2832US2015253238A1Wide bandwidth gw probe for tube and pipe inspection systemACOUSTICEYE LTD·Filed 2015·Application pending·0 cites
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