Inventor · disambiguated record
Phil Nigh
Also filed as: NIGH PHIL
8 granted patents·1 pending application·189 citations·filing 1997–2008
88Inventor score
Top patents by PatentIndex Score
9 records- 0189US5982189ABuilt-in dynamic stress for integrated circuitsIBM·Filed 1997·Granted Nov 9, 1999·89 cites·19 claims
- 0278US7759960B2Integrated circuit testing methods using well bias modificationIBM·Filed 2008·Granted Jul 20, 2010·7 cites·24 claims
- 0376US7400162B2Integrated circuit testing methods using well bias modificationIBM·Filed 2003·Granted Jul 15, 2008·17 cites·6 claims
- 0475US5807763AElectric field test of integrated circuit componentIBM·Filed 1997·Granted Sep 15, 1998·34 cites·4 claims
- 0574US7564256B2Integrated circuit testing methods using well bias modificationINTERNAT BUSINESS MACHINES COM·Filed 2008·Granted Jul 21, 2009·6 cites·2 claims
- 0671US5942911AElectric field test of integrated circuit componentIBM·Filed 1998·Granted Aug 24, 1999·27 cites·12 claims
- 0768US7486098B2Integrated circuit testing method using well bias modificationIBM·Filed 2007·Granted Feb 3, 2009·4 cites·1 claims
- 0858US7428675B2Testing using independently controllable voltage islandsIBM·Filed 2003·Granted Sep 23, 2008·5 cites·18 claims
- 0953US2008284459A1Testing Using Independently Controllable Voltage IslandsIBM·Filed 2008·Application pending·0 cites
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