Inventor · disambiguated record
Biow Hiem Ong
Also filed as: ONG BIOW HIEM
9 granted patents·4 pending applications·23 citations·filing 2010–2025
83Inventor score
Files withMICRON TECHNOLOGY INC7LODESTAR LICENSING GROUP LLC2ONG BIOW-HIEM2LAI CHIEN-HUNG1TAIWAN SEMICONDUCTOR MFG CO LTD1
Top patents by PatentIndex Score
13 records- 0190US11158577B2Methods for fabricating microelectronic devices with contacts to conductive staircase steps, and related devices and systemsMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 26, 2021·4 cites·18 claims
- 0286US11101171B2Apparatus comprising structures including contact vias and conductive lines, related methods, and memory devicesMICRON TECHNOLOGY INC·Filed 2019·Granted Aug 24, 2021·4 cites·28 claims
- 0383US8818072B2Rendered database image-to-inspection image optimization for inspectionONG BIOW-HIEM·Filed 2010·Granted Aug 26, 2014·10 cites·18 claims
- 0478US9063097B2Systems and methods eliminating false defect detectionsONG BIOW-HIEM·Filed 2011·Granted Jun 23, 2015·4 cites·5 claims
- 0577US2025391769A1Microelectronic devices including stadium structures, and related methods and electronic systemsMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0676US2024266214A1Apparatuses and memory devices including conductive lines and interconnect structuresLODESTAR LICENSING GROUP LLC·Filed 2024·Application pending·0 cites
- 0772US2024274538A1Microelectronic devices with conductive extensions between upper staircase steps and their contacts, and related methodsLODESTAR LICENSING GROUP LLC·Filed 2024·Application pending·0 cites
- 0870US11990367B2Apparatus and memory device including conductive lines and contacts, and methods of forming an apparatus including conductive lines and contactsMICRON TECHNOLOGY INC·Filed 2021·Granted May 21, 2024·0 cites·20 claims
- 0965US11967556B2Methods for fabricating microelectronic devices with contacts to conductive staircase steps, and related devices and systemsMICRON TECHNOLOGY INC·Filed 2021·Granted Apr 23, 2024·0 cites·20 claims
- 1062US8629407B2Contamination inspectionLAI CHIEN-HUNG·Filed 2011·Granted Jan 14, 2014·1 cites·20 claims
- 1160US12406926B2Microelectronic devices including stadium structuresMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 2, 2025·0 cites·14 claims
- 1250US9689805B2Systems and methods eliminating false defect detectionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jun 27, 2017·0 cites·20 claims
- 1349US2024321741A1Microelectronic devices including contact structures, and related electronic systems and methodsMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →