Inventor · disambiguated record
Mark Deome
Also filed as: DEOME MARK · DEOME MARK E
11 granted patents·485 citations·filing 1997–2005
92Inventor score
Files withLTX CORP11
Top patents by PatentIndex Score
11 records- 0194US6449741B1Single platform electronic testerLTX CORP·Filed 1998·Granted Sep 10, 2002·127 cites·11 claims
- 0288US6675339B1Single platform electronic testerLTX CORP·Filed 2001·Granted Jan 6, 2004·36 cites·5 claims
- 0386US6332212B1Capturing and displaying computer program execution timingLTX CORP·Filed 1997·Granted Dec 18, 2001·188 cites·38 claims
- 0484US7191368B1Single platform electronic testerLTX CORP·Filed 2001·Granted Mar 13, 2007·28 cites·10 claims
- 0580US7092837B1Single platform electronic testerLTX CORP·Filed 2003·Granted Aug 15, 2006·28 cites·4 claims
- 0678US6703825B1Separating device response signals from composite signalsLTX CORP·Filed 2003·Granted Mar 9, 2004·19 cites·17 claims
- 0774US6563298B1Separating device response signals from composite signalsLTX CORP·Filed 2000·Granted May 13, 2003·16 cites·25 claims
- 0868US6560756B1Method and apparatus for distributed test pattern decompressionLTX CORP·Filed 2001·Granted May 6, 2003·17 cites·44 claims
- 0965US6512989B1Generating and controlling analog and digital signals on a mixed signal test systemLTX CORP·Filed 1999·Granted Jan 28, 2003·26 cites·37 claims
- 1032US7512857B1Pattern correction circuitLTX CORP·Filed 2005·Granted Mar 31, 2009·0 cites·11 claims
- 1121US6768960B2System for and method of performing device-oriented testsLTX CORP·Filed 2001·Granted Jul 27, 2004·0 cites·11 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →