Inventor · disambiguated record
Paul Chang
Also filed as: CHANG PAUL · CHANG PAUL CHINLING
5 granted patents·14 citations·filing 2007–2015
75Inventor score
Top patents by PatentIndex Score
5 records- 0190US10288583B2Defect discrimination apparatus, methods, and systemsHALLIBURTON ENERGY SERVICES INC·Filed 2015·Granted May 14, 2019·6 cites·20 claims
- 0284US8239790B2Methods and system for analysis and management of parametric yieldCULP JAMES A·Filed 2011·Granted Aug 7, 2012·4 cites·20 claims
- 0366US8429576B2Methods and system for analysis and management of parametric yieldCULP JAMES A·Filed 2012·Granted Apr 23, 2013·1 cites·20 claims
- 0465US8042070B2Methods and system for analysis and management of parametric yieldIBM·Filed 2007·Granted Oct 18, 2011·3 cites·20 claims
- 0556US8997028B2Methods and system for analysis and management of parametric yieldMENTOR GRAPHICS CORP·Filed 2013·Granted Mar 31, 2015·0 cites·8 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →