Inventor · disambiguated record
Hisao Igarashi
Also filed as: IGARASHI HISAO
13 granted patents·2 pending applications·184 citations·filing 1992–2007
92Inventor score
Top patents by PatentIndex Score
15 records- 0183US7221073B2Axial gap electronic motorFUJITSU GENERAL LTD·Filed 2004·Granted May 22, 2007·31 cites·21 claims
- 0280US7671609B2Sheet-like probe, method of producing the probe, and application of the probeJSR CORP·Filed 2005·Granted Mar 2, 2010·7 cites·7 claims
- 0379US6604953B2Anisotropically conductive sheet and connectorJSR CORP·Filed 2001·Granted Aug 12, 2003·28 cites·18 claims
- 0478US7446544B2Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting methodJSR CORP·Filed 2005·Granted Nov 4, 2008·6 cites·10 claims
- 0576US7737707B2Sheet-like probe, method of producing the probe, and application of the probeJSR CORP·Filed 2005·Granted Jun 15, 2010·5 cites·14 claims
- 0675US7135800B2Axial gap electronic motorFUJITSU GENERAL LTD·Filed 2004·Granted Nov 14, 2006·20 cites·10 claims
- 0774US6870385B2Anisotropic conductive sheet and wafer inspection deviceJSR CORP·Filed 2001·Granted Mar 22, 2005·18 cites·14 claims
- 0873US7656176B2Probe member for wafer inspection, probe card for wafer inspection and wafer inspection equipmentJSR CORP·Filed 2005·Granted Feb 2, 2010·5 cites·7 claims
- 0971US7384279B2Anisotropic conductive connector and wafer inspection deviceJSR CORP·Filed 2004·Granted Jun 10, 2008·14 cites·10 claims
- 1070US8042257B2Method for manufacturing a stator core for an axial air-gap electronic motorFUJITSU GENERAL LTD·Filed 2007·Granted Oct 25, 2011·6 cites·8 claims
- 1164US7311531B2Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection methodJSR CORP·Filed 2004·Granted Dec 25, 2007·11 cites·13 claims
- 1260US6849335B2Anisotropic conductive sheetJSR CORP·Filed 2001·Granted Feb 1, 2005·12 cites·20 claims
- 1360US5344593AElectroconductive elastomer-forming compositionJAPAN SYNTHETIC RUBBER CO LTD·Filed 1992·Granted Sep 6, 1994·21 cites·16 claims
- 1439US2007268032A1Probe Member for Wafer Inspection, Probe Card for Wafer Inspection and Wafer Inspection ApparatusJSR CORP·Filed 2005·Application pending·0 cites
- 1538US2005140233A1Air blower apparatusFUJITSU GENERAL LTD·Filed 2004·Application pending·0 cites
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