Inventor · disambiguated record
Jun Etoh
Also filed as: ETOH JUN
59 granted patents·1 pending application·2,173 citations·filing 1975–2022
99Inventor score
Files withHITACHI LTD48HITACHI HIGH TECH CORP3RENESAS TECH CORP3HITACHI ULSI SYS CO LTD2HITACHI VLSI ENG2
Top patents by PatentIndex Score
60 records- 0198US5539279AFerroelectric memoryHITACHI LTD·Filed 1994·Granted Jul 23, 1996·218 cites·30 claims
- 0298US5297097ALarge scale integrated circuit for low voltage operationHITACHI LTD·Filed 1989·Granted Mar 22, 1994·121 cites·16 claims
- 0398US4086642AProtective circuit and device for metal-oxide-semiconductor field effect transistor and method for fabricating the deviceHITACHI LTD·Filed 1976·Granted Apr 25, 1978·119 cites·4 claims
- 0498US4021835ASemiconductor device and a method for fabricating the sameHITACHI LTD·Filed 1975·Granted May 3, 1977·158 cites·2 claims
- 0597US5526313ALarge scale integrated circuit with sense amplifier circuits for low voltage operationHITACHI LTD·Filed 1993·Granted Jun 11, 1996·156 cites·12 claims
- 0694US4994688ASemiconductor device having a reference voltage generating circuitHITACHI LTD·Filed 1989·Granted Feb 19, 1991·105 cites·18 claims
- 0794US4811299ADynamic RAM device having a separate test mode capabilityHITACHI LTD·Filed 1987·Granted Mar 7, 1989·61 cites·20 claims
- 0892US6909647B2Semiconductor device having redundancy circuitRENESAS TECH CORP·Filed 2004·Granted Jun 21, 2005·38 cites·11 claims
- 0992US5426616ASemiconductor IC device having a voltage conversion circuit which generates an internal supply voltage having value compensated for external supply voltage variationsHITACHI LTD·Filed 1994·Granted Jun 20, 1995·95 cites·89 claims
- 1091US4716313APulse drive circuitHITACHI LTD·Filed 1987·Granted Dec 29, 1987·50 cites·9 claims
- 1190US6337817B1Semiconductor device having redundancy circuitHITACHI LTD·Filed 2000·Granted Jan 8, 2002·34 cites·20 claims
- 1290US5617365ASemiconductor device having redundancy circuitHITACHI LTD·Filed 1995·Granted Apr 1, 1997·48 cites·25 claims
- 1389USRE37593ELarge scale integrated circuit with sense amplifier circuits for low voltage operationHITACHI LTD·Filed 1998·Granted Mar 19, 2002·57 cites·83 claims
- 1488US5262999ALarge scale integrated circuit for low voltage operationHITACHI LTD·Filed 1992·Granted Nov 16, 1993·68 cites·29 claims
- 1587US7499340B2Semiconductor memory device and defect remedying method thereofHITACHI LTD·Filed 2008·Granted Mar 3, 2009·8 cites·18 claims
- 1687US4992985AMethod for selectively initiating/terminating a test mode in an address multiplexed DRAM and address multiplexed DRAM having such a capabilityHITACHI LTD·Filed 1989·Granted Feb 12, 1991·34 cites·33 claims
- 1786US5384740AReference voltage generatorHITACHI LTD·Filed 1993·Granted Jan 24, 1995·54 cites·13 claims
- 1886US4796234ASemiconductor memory having selectively activated blocks including CMOS sense amplifiersHITACHI LTD·Filed 1986·Granted Jan 3, 1989·48 cites·13 claims
- 1985US6515913B2Semiconductor memory device and defect remedying method thereofHITACHI LTD·Filed 2001·Granted Feb 4, 2003·22 cites·5 claims
- 2085US5265055ASemiconductor memory having redundancy circuitHITACHI LTD·Filed 1991·Granted Nov 23, 1993·59 cites·12 claims
- 2184US6335884B1Semiconductor memory device and defect remedying method thereofHITACHI LTD·Filed 2000·Granted Jan 1, 2002·22 cites·5 claims
- 2283US5262993ASemiconductor memory having redundancy circuit with means to switch power from a normal memory block to a spare memory blockHITACHI LTD·Filed 1991·Granted Nov 16, 1993·41 cites·13 claims
- 2382US6212089B1Semiconductor memory device and defect remedying method thereofHITACHI LTD·Filed 2000·Granted Apr 3, 2001·18 cites·5 claims
- 2481US7203101B2Semiconductor memory device and defect remedying method thereofHITACHI ULSI SYS CO LTD·Filed 2006·Granted Apr 10, 2007·5 cites·6 claims
- 2581US4635146AReel brake and associated tension arm control device for a reversible tape recording and/or reproducing apparatusVICTOR COMPANY OF JAPAN·Filed 1984·Granted Jan 6, 1987·24 cites·4 claims
- 2681US4503522ADynamic type semiconductor monolithic memoryHITACHI LTD·Filed 1982·Granted Mar 5, 1985·29 cites·27 claims
- 2779US5376839ALarge scale integrated circuit having low internal operating voltageHITACHI LTD·Filed 1993·Granted Dec 27, 1994·38 cites·6 claims
- 2878US7345929B2Semiconductor memory device and defect remedying method thereofHITACHI LTD·Filed 2007·Granted Mar 18, 2008·4 cites·10 claims
- 2977US6754114B2Semiconductor device having redundancy circuitRENESAS TECH CORP·Filed 2003·Granted Jun 22, 2004·13 cites·11 claims
- 3076US5602771ASemiconductor memory device and defect remedying method thereofHITACHI LTD·Filed 1993·Granted Feb 11, 1997·43 cites·11 claims
- 3176US5579256ASemiconductor memory device and defect remedying method thereofHITACHI LTD·Filed 1995·Granted Nov 26, 1996·45 cites·6 claims
- 3275US7106643B2Method for manufacturing memory device provided with a defect recovery mechanism featuring a redundancy circuitRENESAS TECH CORP·Filed 2005·Granted Sep 12, 2006·5 cites·10 claims
- 3374US6657901B2Semiconductor device formed in a rectangle region on a semiconductor substrate including a voltage generating circuitHITACHI LTD·Filed 2002·Granted Dec 2, 2003·11 cites·41 claims
- 3472US4873672ADynamic random access memory capable of fast erasing of storage dataHITACHI LTD·Filed 1987·Granted Oct 10, 1989·28 cites·15 claims
- 3571US6898130B2Semiconductor memory device and defect remedying method thereofHITACHI VLSI ENG·Filed 2003·Granted May 24, 2005·9 cites·6 claims
- 3671US6577544B2Semiconductor device having redundancy circuitHITACHI LTD·Filed 2001·Granted Jun 10, 2003·10 cites·14 claims
- 3770US7016236B2Semiconductor memory device and defect remedying method thereofHITACHI ULSI SYS CO LTD·Filed 2005·Granted Mar 21, 2006·2 cites·10 claims
- 3869US6049500ASemiconductor memory device and defect remedying method thereofHITACHI LTD·Filed 1998·Granted Apr 11, 2000·28 cites·10 claims
- 3969US5815448ASemiconductor memory having redundancy circuitHITACHI LTD·Filed 1997·Granted Sep 29, 1998·16 cites·34 claims
- 4068US5179539ALarge scale integrated circuit having low internal operating voltageHITACHI VLSI ENG·Filed 1992·Granted Jan 12, 1993·28 cites·21 claims
- 4168US5117393AMethod of testing memory cells in an address multiplexed dynamic ram including test mode selectionHITACHI LTD·Filed 1991·Granted May 26, 1992·19 cites·6 claims
- 4266US12422451B2Camera holding device for automatic analysis apparatusHITACHI HIGH TECH CORP·Filed 2022·Granted Sep 23, 2025·0 cites·8 claims
- 4364US5955896AInput buffer using a differential amplifierHITACHI LTD·Filed 1996·Granted Sep 21, 1999·18 cites·38 claims
- 4462US11664185B2Vibration damping system for charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2021·Granted May 30, 2023·0 cites·5 claims
- 4561USRE40132ELarge scale integrated circuit with sense amplifier circuits for low voltage operationELPIDA MEMORY INC·Filed 2001·Granted Mar 4, 2008·11 cites·29 claims
- 4660US6160744ASemiconductor memory device and defect remedying method thereofHITACHI LTD·Filed 1999·Granted Dec 12, 2000·18 cites·45 claims
- 4759US5402376ASemiconductor memory having redundancy circuitHITACHI LTD·Filed 1993·Granted Mar 28, 1995·14 cites·23 claims
- 4857US5086414ASemiconductor device having latch meansHITACHI LTD·Filed 1989·Granted Feb 4, 1992·15 cites·29 claims
- 4957US4965769ASemiconductor memory capable of high-speed data erasingHITACHI LTD·Filed 1988·Granted Oct 23, 1990·15 cites·23 claims
- 5056US5331596AAddress multiplexed dynamic RAM having a test mode capabilityHITACHI LTD·Filed 1992·Granted Jul 19, 1994·11 cites·33 claims
Showing the top 50 of 60 patent records by PatentIndex Score.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →