Inventor · disambiguated record
Andrew T. Appel
Also filed as: APPEL ANDREW · APPEL ANDREW T · APPEL ANDREW THORTON
14 granted patents·943 citations·filing 1989–2008
95Inventor score
Top patents by PatentIndex Score
14 records- 0197US5536202ASemiconductor substrate conditioning head having a plurality of geometries formed in a surface thereof for pad conditioning during chemical-mechanical polishTEXAS INSTRUMENTS INC·Filed 1994·Granted Jul 16, 1996·172 cites·20 claims
- 0297US5088036AReal time, concurrent garbage collection system and methodDIGITAL EQUIPMENT CORP·Filed 1989·Granted Feb 11, 1992·363 cites·7 claims
- 0394US5522965ACompact system and method for chemical-mechanical polishing utilizing energy coupled to the polishing pad/water interfaceTEXAS INSTRUMENTS INC·Filed 1994·Granted Jun 4, 1996·99 cites·21 claims
- 0492US6653681B2Additional capacitance for MIM capacitors with no additional processingTEXAS INSTRUMENTS INC·Filed 2001·Granted Nov 25, 2003·75 cites·16 claims
- 0583US5595922AProcess for thickening selective gate oxide regionsTEXAS INSTRUMENTS INC·Filed 1994·Granted Jan 21, 1997·55 cites·14 claims
- 0672US5906754AApparatus integrating pad conditioner with a wafer carrier for chemical-mechanical polishing applicationsTEXAS INSTRUMENTS INC·Filed 1996·Granted May 25, 1999·41 cites·18 claims
- 0772US5595527AApplication of semiconductor IC fabrication techniques to the manufacturing of a conditioning head for pad conditioning during chemical-mechanical polishTEXAS INSTRUMENTS INC·Filed 1995·Granted Jan 21, 1997·27 cites·20 claims
- 0869US7977230B2Rectangular contact used as a low voltage fuse elementTEXAS INSTRUMENTS INC·Filed 2008·Granted Jul 12, 2011·3 cites·8 claims
- 0969US6150669ACombination test structures for in-situ measurements during fabrication of semiconductor devicesTEXAS INSTRUMENTS INC·Filed 1999·Granted Nov 21, 2000·34 cites·10 claims
- 1069US6030864AVertical NPN transistor for 0.35 micrometer node CMOS logic technologyTEXAS INSTRUMENTS INC·Filed 1997·Granted Feb 29, 2000·30 cites·8 claims
- 1166US6774457B2Rectangular contact used as a low voltage fuse elementTEXAS INSTRUMENTS INC·Filed 2002·Granted Aug 10, 2004·10 cites·8 claims
- 1265US5605861AThin polysilicon doping by diffusion from a doped silicon dioxide filmTEXAS INSTRUMENTS INC·Filed 1995·Granted Feb 25, 1997·25 cites·12 claims
- 1345US7442626B2Rectangular contact used as a low voltage fuse elementTEXAS INSTRUMENTS INC·Filed 2004·Granted Oct 28, 2008·1 cites·12 claims
- 1444US5755979AApplication of semiconductor IC fabrication techniques to the manufacturing of a conditioning head for pad conditioning during chemical-mechanical polishTEXAS INSTRUMENTS INC·Filed 1996·Granted May 26, 1998·8 cites·10 claims
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