Inventor
KOH CHA WON
KR55 patents
⚠️ This page may combine multiple inventors who share the name “KOH CHA WON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
23 patentsUS9520289B2Dec 13, 2016
Methods of forming a pattern of a semiconductor device
SAMSUNG ELECTRONICS CO LTD374 citations99
US9772555B2Sep 26, 2017
Methods of forming patterns using photoresists
SAMSUNG ELECTRONICS CO LTD52 citations93
US8003543B2Aug 23, 2011
Method of forming a hard mask and method of forming a fine pattern of semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD21 citations92
US7732341B2Jun 8, 2010
Method of forming a hard mask and method of forming a fine pattern of semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD18 citations92
US7540970B2Jun 2, 2009
Methods of fabricating a semiconductor device
SAMSUNG ELECTRONICS CO LTD27 citations92
US7892982B2Feb 22, 2011
Method for forming fine patterns of a semiconductor device using a double patterning process
SAMSUNG ELECTRONICS CO LTD19 citations84
US7560768B2Jul 14, 2009
Nonvolatile memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD8 citations84
US10797056B2Oct 6, 2020
Semiconductor device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD7 citations83
US7687369B2Mar 30, 2010
Method of forming fine metal patterns for a semiconductor device using a damascene process
SAMSUNG ELECTRONICS CO LTD7 citations74
US10586798B2Mar 10, 2020
Semiconductor device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD4 citations72
US9482953B2Nov 1, 2016
Lithography apparatus having effective thermal electron enhancement unit and method of forming pattern using the same
SAMSUNG ELECTRONICS CO LTD2 citations63
US7998874B2Aug 16, 2011
Method for forming hard mask patterns having a fine pitch and method for forming a semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD5 citations63
US7862988B2Jan 4, 2011
Method for forming patterns of semiconductor device
SAMSUNG ELECTRONICS CO LTD6 citations63
US12372885B2Jul 29, 2025
Substrate processing apparatus and method of fabricating semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD0 citations62
US11927890B1Mar 12, 2024
Substrate processing apparatus and method of fabricating semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD0 citations62
US7787301B2Aug 31, 2010
Flash memory device using double patterning technology and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD4 citations62
US7678650B2Mar 16, 2010
Nonvolatile memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD3 citations62
US7582899B2Sep 1, 2009
Semiconductor device having overlay measurement mark and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD3 citations62
US7452825B2Nov 18, 2008
Method of forming a mask structure and method of forming a minute pattern using the same
SAMSUNG ELECTRONICS CO LTD5 citations62
US7387869B2Jun 17, 2008
Method of forming pattern for semiconductor device
SAMSUNG ELECTRONICS CO LTD1 citations52
US9412604B2Aug 9, 2016
Methods of manufacturing semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations51
US7842451B2Nov 30, 2010
Method of forming pattern
SAMSUNG ELECTRONICS CO LTD0 citations50
US7575855B2Aug 18, 2009
Method of forming pattern
SAMSUNG ELECTRONICS CO LTD0 citations50
HYUNDAI ELECTRONICS IND
15 patentsUS6599844B2Jul 29, 2003
Method and forming fine patterns of semiconductor devices using passivation layers
HYUNDAI ELECTRONICS IND40 citations93
US6410670B1Jun 25, 2002
Photoresist monomer having hydroxy group and carboxy group, copolymer thereof and photoresist composition using the same
HYUNDAI ELECTRONICS IND16 citations93
US6235447B1May 22, 2001
Photoresist monomers, polymers thereof, and photoresist compositions containing the same
HYUNDAI ELECTRONICS IND38 citations93
US6764806B2Jul 20, 2004
Over-coating composition for photoresist, and processes for forming photoresist patterns using the same
HYUNDAI ELECTRONICS IND17 citations84
US6627378B1Sep 30, 2003
Photoresist composition for top-surface imaging process by silylation
HYUNDAI ELECTRONICS IND6 citations74
US6399272B1Jun 4, 2002
Phenylenediamine derivative-type additive useful for a chemically amplified photoresist
HYUNDAI ELECTRONICS IND11 citations74
US6387589B1May 14, 2002
Photoresist polymers and photoresist compositions containing the same
HYUNDAI ELECTRONICS IND11 citations74
US6368771B1Apr 9, 2002
Photoresist polymers and photoresist compositions containing the same
HYUNDAI ELECTRONICS IND9 citations74
US6348296B1Feb 19, 2002
Copolymer resin, preparation thereof, and photoresist using the same
HYUNDAI ELECTRONICS IND9 citations74
US6200731B1Mar 13, 2001
Photoresist cross-linking monomers, photoresist polymers and photoresist compositions comprising the same
HYUNDAI ELECTRONICS IND11 citations74
US5888698AMar 30, 1999
Photoresist film for deep ultra violet and method for forming photoresist film pattern using the same
HYUNDAI ELECTRONICS IND9 citations74
US6699644B1Mar 2, 2004
Process for forming a photoresist pattern comprising alkaline treatment
HYUNDAI ELECTRONICS IND4 citations63
US6017676AJan 25, 2000
Photoresist composition comprising a copolymer resin
HYUNDAI ELECTRONICS IND6 citations63
US6586619B2Jul 1, 2003
Photoresist monomer having hydroxy group and carboxy group, copolymer thereof and photoresist composition using the same
HYUNDAI ELECTRONICS IND1 citations52
US6087065AJul 11, 2000
Photoresist film for deep ultra violet and method for forming photoresist film pattern using the same
HYUNDAI ELECTRONICS IND1 citations52
HYNIX SEMICONDUCTOR INC
7 patentsUS6984482B2Jan 10, 2006
Top-coating composition for photoresist and process for forming fine pattern using the same
HYNIX SEMICONDUCTOR INC6 citations74
US6664031B2Dec 16, 2003
Process for forming photoresist pattern by using gas phase amine treatment
HYNIX SEMICONDUCTOR INC7 citations74
US6858371B2Feb 22, 2005
Maleimide-photoresist monomers containing halogen, polymers thereof and photoresist compositions comprising the same
HYNIX SEMICONDUCTOR INC5 citations63
US6610616B2Aug 26, 2003
Method for forming micro-pattern of semiconductor device
HYNIX SEMICONDUCTOR INC5 citations63
US6833326B2Dec 21, 2004
Method for forming fine patterns in semiconductor device
HYNIX SEMICONDUCTOR INC6 citations61
US7329477B2Feb 12, 2008
Process for forming a fine pattern using a top-coating composition for a photoresist and product formed by same
HYNIX SEMICONDUCTOR INC1 citations52
US6770415B2Aug 3, 2004
Photoresist polymer for top-surface imaging process by silylation and photoresist composition containing the same
HYNIX SEMICONDUCTOR INC1 citations52
KOH CHA-WON
3 patentsUS8278221B2Oct 2, 2012
Method of forming a hard mask and method of forming a fine pattern of semiconductor device using the same
KOH CHA-WON18 citations91
US9147687B2Sep 29, 2015
Methods of fabricating semiconductor devices
KOH CHA-WON10 citations83
US8557131B2Oct 15, 2013
Methods of forming fine patterns and methods of fabricating semiconductor devices
KOH CHA-WON2 citations60
PARK JIN
2 patentsUS10345701B2Jul 9, 2019
Photoresist polymers, photoresist compositions, methods of forming patterns and methods of manufacturing semiconductor devices
PARK JIN0 citations51
US9842852B2Dec 12, 2017
Methods of forming patterns using photoresist polymers and methods of manufacturing semiconductor devices
PARK JIN1 citations51
Showing the top 50 of 55 patents by PatentIndex Score.