Inventor · disambiguated record
Shingo Inazumi
Also filed as: INAZUMI SHINGO
12 granted patents·32 citations·filing 2011–2019
86Inventor score
Top patents by PatentIndex Score
12 records- 0190US11619591B2Image inspection apparatus and image inspection methodOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Apr 4, 2023·4 cites·13 claims
- 0289US10417754B2Inspection systemOMRON TATEISI ELECTRONICS CO·Filed 2017·Granted Sep 17, 2019·4 cites·16 claims
- 0382US8714771B2Illumination apparatus and illumination system including a plurality of illumination apparatusesNISHIMORI NAOKI·Filed 2011·Granted May 6, 2014·11 cites·9 claims
- 0478US8950896B2Illumination apparatusNISHIMORI NAOKI·Filed 2011·Granted Feb 10, 2015·4 cites·9 claims
- 0577US11080843B2Image inspecting apparatus, image inspecting method and image inspecting programOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Aug 3, 2021·2 cites·20 claims
- 0676US10863069B2Image processing system and setting methodOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Dec 8, 2020·2 cites·18 claims
- 0774US10748020B2Controller and image processing systemOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Aug 18, 2020·1 cites·7 claims
- 0851US11536667B2Image inspection apparatus and image inspection methodOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Dec 27, 2022·0 cites·20 claims
- 0947USD911419SMain body of image inspection cameraOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Feb 23, 2021·4 cites·1 claims
- 1046US11567013B2Image inspection device and lighting deviceOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Jan 31, 2023·0 cites·18 claims
- 1146US10909672B2Appearance inspection system, image processing device, setting device, and inspection methodOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Feb 2, 2021·0 cites·20 claims
- 1244US11303821B2Illumination device, illumination unit, and image processing systemOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Apr 12, 2022·0 cites·9 claims
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