Inventor · disambiguated record
Hiroshi Tooyama
Also filed as: TOOYAMA HIROSHI
10 granted patents·407 citations·filing 1982–2008
92Inventor score
Top patents by PatentIndex Score
10 records- 0199US6172363B1Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 1997·Granted Jan 9, 2001·185 cites·20 claims
- 0297US6329826B1Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 2000·Granted Dec 11, 2001·95 cites·4 claims
- 0396US7417444B2Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 2005·Granted Aug 26, 2008·25 cites·7 claims
- 0491US7408760B2Charged particle beam application systemHITACHI HIGH TECH CORP·Filed 2005·Granted Aug 5, 2008·21 cites·12 claims
- 0590US7952074B2Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 2008·Granted May 31, 2011·8 cites·18 claims
- 0685US6559663B2Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 2001·Granted May 6, 2003·20 cites·10 claims
- 0784US7026830B2Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 2003·Granted Apr 11, 2006·19 cites·6 claims
- 0861US5001409ASurface metrological apparatusHITACHI LTD·Filed 1988·Granted Mar 19, 1991·12 cites·19 claims
- 0953US4541082ADevice for optically tracking informationHITACHI LTD·Filed 1982·Granted Sep 10, 1985·8 cites·10 claims
- 1047US5369396AApparatus for detecting a level of liquidTOYOTA MOTOR CO LTD·Filed 1993·Granted Nov 29, 1994·14 cites·8 claims
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