Inventor · disambiguated record

Hidehito Yokomori

Also filed as: YOKOMORI HIDEHITO

2 granted patents·157 citations·filing 1996–1997

70Inventor score

Technology areasG01R G09G

Files withTOKYO ELECTRON LTD2

Top patents by PatentIndex Score

2 records

0190US5742173AMethod and apparatus for probe testing substrateTOKYO ELECTRON LTD·Filed 1996·Granted Apr 21, 1998·101 cites·12 claims
0274US5801764AMonitor device and monitor methodTOKYO ELECTRON LTD·Filed 1997·Granted Sep 1, 1998·56 cites·27 claims

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