Inventor · disambiguated record
Neil Clayton
Also filed as: CLAYTON NEIL · CLAYTON NEIL C
12 granted patents·1 pending application·46 citations·filing 2009–2023
89Inventor score
Top patents by PatentIndex Score
13 records- 0179US9917399B2Reduced stress electrical connectorTEKTRONIX INC·Filed 2016·Granted Mar 13, 2018·8 cites·16 claims
- 0277US8640333B2Method of manufacturing an electrical contact assemblyLYFORD J STEVEN·Filed 2011·Granted Feb 4, 2014·5 cites·4 claims
- 0371USD1003181STest and measurement instrument and accessoriesTEKTRONIX INC·Filed 2021·Granted Oct 31, 2023·4 cites·1 claims
- 0469USD909899SHousing for a test and measurement instrumentTEKTRONIX INC·Filed 2019·Granted Feb 9, 2021·11 cites·1 claims
- 0565US8963568B2Resistive probing tip system for logic analyzer probing systemBOOMAN RICHARD A·Filed 2011·Granted Feb 24, 2015·2 cites·20 claims
- 0662USD1080629SProtective case for a test and measurement instrumentTEKTRONIX INC·Filed 2022·Granted Jun 24, 2025·3 cites·1 claims
- 0759USD1038798STest and measurement instrument with stand and batteryTEKTRONIX INC·Filed 2023·Granted Aug 13, 2024·1 cites·1 claims
- 0859US8714988B1Connector for selectively coupling an electrical load to a device under testTEKTRONIX INC·Filed 2012·Granted May 6, 2014·1 cites·20 claims
- 0953USD808970SStacking system support for electronic equipmentTEKTRONIX INC·Filed 2016·Granted Jan 30, 2018·5 cites·1 claims
- 1052USD776106SStacking system for electronic equipmentTEKTRONIX INC·Filed 2015·Granted Jan 10, 2017·5 cites·1 claims
- 1142USD1038797SBattery accessory for a test and measurement instrumentTEKTRONIX INC·Filed 2023·Granted Aug 13, 2024·0 cites·1 claims
- 1242US2010105256A1Electrical Contact Assembly and Method of ManufactureTEKTRONIX INC·Filed 2009·Application pending·0 cites
- 1333USD808969SStacking system support for electronic equipmentTEKTRONIX INC·Filed 2016·Granted Jan 30, 2018·1 cites·1 claims
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