Inventor · disambiguated record
Akihiro Onizawa
Also filed as: ONIZAWA AKIHIRO
4 granted patents·1 pending application·32 citations·filing 2008–2014
73Inventor score
Top patents by PatentIndex Score
5 records- 0191US7732792B2Pattern measurement apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 8, 2010·23 cites·5 claims
- 0284US8445871B2Pattern measurement apparatusMATSUOKA RYOICHI·Filed 2010·Granted May 21, 2013·6 cites·16 claims
- 0365US9057873B2Global alignment using multiple alignment pattern candidatesMIYAMOTO ATSUSHI·Filed 2011·Granted Jun 16, 2015·2 cites·7 claims
- 0463US10545018B2Pattern measurement device, and computer program for measuring patternHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 28, 2020·1 cites·11 claims
- 0538US2015146967A1Pattern evaluation device and pattern evaluation methodHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →