Inventor · disambiguated record

Yoshikazu Urushiyama

Also filed as: URUSHIYAMA YOSHIKAZU

1 granted patent·1 pending application·20 citations·filing 2006–2007

40Inventor score

Technology areasG01R

Files withNIHON MICRONICS KK2

Top patents by PatentIndex Score

2 records

0187US7888958B2Current test probe having a solder guide portion, and related probe assembly and production methodNIHON MICRONICS KK·Filed 2006·Granted Feb 15, 2011·20 cites·13 claims
0234US2009009197A1Probe for electrical testNIHON MICRONICS KK·Filed 2007·Application pending·0 cites

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Yoshikazu Urushiyama — Patent Inventor | PatentIndex