Inventor · disambiguated record

David Hellin

Also filed as: HELLIN DAVID

1 granted patent·6 citations·filing 2004–2004

28Inventor score

Technology areasG01N

Files withIMEC INTER UNI MICRO ELECTR1

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1 record

0157US7399635B2Impurity measuring method for Ge substratesIMEC INTER UNI MICRO ELECTR·Filed 2004·Granted Jul 15, 2008·6 cites·29 claims

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