Inventor · disambiguated record
Hisakazu Yoshino
Also filed as: YOSHINO HISAKAZU
20 granted patents·523 citations·filing 1980–1998
96Inventor score
Top patents by PatentIndex Score
20 records- 0190US6084716AOptical substrate inspection apparatusTOSHIBA KK·Filed 1998·Granted Jul 4, 2000·89 cites·21 claims
- 0288US6104481ASurface inspection apparatusTOPCON CORP·Filed 1998·Granted Aug 15, 2000·113 cites·12 claims
- 0378US4902133AMethod and an apparatus for aligning first and second objects with each otherTOSHIBA KK·Filed 1988·Granted Feb 20, 1990·25 cites·49 claims
- 0469US4702570AStereo-microscope with two observation optical systems each including a right angle prism and a roof right angle prism providing both rotation and relative separation adjustmentsTOKYO OPTICAL·Filed 1986·Granted Oct 27, 1987·25 cites·1 claims
- 0567US4984890AMethod and an apparatus for aligning first and second objects with each otherTOSHIBA KK·Filed 1989·Granted Jan 15, 1991·15 cites·24 claims
- 0667US4601550AStereo-microscope with a common objective lens systemTOKYO OPTICAL·Filed 1984·Granted Jul 22, 1986·18 cites·12 claims
- 0761US4711541ASlit lamp and accessory device thereofTOKYO OPTICAL·Filed 1985·Granted Dec 8, 1987·61 cites·14 claims
- 0855US5369521AScanning type projectorTOPCON CORP·Filed 1992·Granted Nov 29, 1994·12 cites·6 claims
- 0952US4571842ALens judging apparatus of lens meterTOKYO OPTICAL·Filed 1984·Granted Feb 25, 1986·12 cites·4 claims
- 1051US5673135AScanning projection optical deviceTOPCON CORP·Filed 1996·Granted Sep 30, 1997·18 cites·4 claims
- 1151US4711540AEye disease inspecting instrumentTOKYO OPTICAL·Filed 1985·Granted Dec 8, 1987·40 cites·17 claims
- 1250US5828457ASample inspection apparatus and sample inspection methodTOSHIBA KK·Filed 1997·Granted Oct 27, 1998·14 cites·28 claims
- 1349US4632528AMethod for determining refractive index of an objectTOKYO OPTICAL·Filed 1985·Granted Dec 30, 1986·38 cites·4 claims
- 1445US4808002AMethod and device for aligning first and second objects relative to each otherTOSHIBA KK·Filed 1988·Granted Feb 28, 1989·7 cites·19 claims
- 1540US5812259AMethod and apparatus for inspecting slight defects in a photomask patternTOPCON CORP·Filed 1996·Granted Sep 22, 1998·7 cites·7 claims
- 1640US5298096AMethod of producing a lensTOPCON CORP·Filed 1992·Granted Mar 29, 1994·10 cites·5 claims
- 1739US6100970AApparatus for inspecting slight defects on a photomask patternTOPCON CORP·Filed 1998·Granted Aug 8, 2000·6 cites·8 claims
- 1831US5448416AWide-field exposure optical systemTOPCON CORP·Filed 1993·Granted Sep 5, 1995·3 cites·2 claims
- 1931US4597650ASpecular microscopeTOKYO OPTICAL·Filed 1983·Granted Jul 1, 1986·5 cites·5 claims
- 2029US4564291AProjection type lensmeterTOKYO OPTICAL·Filed 1980·Granted Jan 14, 1986·5 cites·1 claims
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