Inventor · disambiguated record
Tomonobu Hiramatsu
Also filed as: HIRAMATSU TOMONOBU
2 granted patents·2 pending applications·3 citations·filing 2001–2013
38Inventor score
Top patents by PatentIndex Score
4 records- 0141US9400307B2Test system for improving throughout or maintenance properties of semiconductor testingKEYSIGHT TECHNOLOGIES INC·Filed 2013·Granted Jul 26, 2016·0 cites·11 claims
- 0237US6559782B2Method of determining measuring time for an analog-digital converterAGILENT TECHNOLOGIES INC·Filed 2001·Granted May 6, 2003·3 cites·11 claims
- 0326US2004160231A1Capacitance measurement systemFiled 2003·Application pending·0 cites
- 0424US2005275405A1Switching matrix apparatus for semiconductor characteristic measurement apparatusAGILENT TECHNOLOGIES INC·Filed 2005·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →