Inventor · disambiguated record
Wolfgang Alexander Iff
Also filed as: IFF WOLFGANG · IFF WOLFGANG ALEXANDER
5 granted patents·1 pending application·0 citations·filing 2016–2024
59Inventor score
Top patents by PatentIndex Score
6 records- 0175US12444039B2Method and a system for characterising structures through a substrateUNITY SEMICONDUCTOR·Filed 2024·Granted Oct 14, 2025·0 cites·17 claims
- 0269US12079979B2Method and a system for characterising structures through a substrateUNITY SEMICONDUCTOR·Filed 2023·Granted Sep 3, 2024·0 cites·13 claims
- 0361US12123698B1Method and a system for characterizing structures through a substrateUNITY SEMICONDUCTOR·Filed 2024·Granted Oct 22, 2024·0 cites·15 claims
- 0458US11959736B2Method and a system for characterising structures etched in a substrateUNITY SEMICONDUCTOR·Filed 2023·Granted Apr 16, 2024·0 cites·15 claims
- 0554US11959737B2Method and a system for combined characterisation of structures etched in a substrateUNITY SEMICONDUCTOR·Filed 2023·Granted Apr 16, 2024·0 cites·13 claims
- 0627US2018046087A1Numerical calculation of the diffraction of a structureIFF WOLFGANG·Filed 2016·Application pending·0 cites
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