Inventor · disambiguated record
Shimon Koren
Also filed as: KOREN SHIMON
12 granted patents·3 pending applications·31 citations·filing 2008–2024
86Inventor score
Top patents by PatentIndex Score
15 records- 0188US11927545B1Semiconductor edge and bevel inspection tool systemCAMTEK LTD·Filed 2023·Granted Mar 12, 2024·3 cites·25 claims
- 0282US9418413B1System and a method for automatic recipe validation and selectionKOREN SHIMON·Filed 2010·Granted Aug 16, 2016·11 cites·19 claims
- 0381US10222517B2Aperture stopCAMTEK LTD·Filed 2017·Granted Mar 5, 2019·4 cites·39 claims
- 0476US9756313B2High throughput and low cost height triangulation system and methodCAMTEK LTD·Filed 2014·Granted Sep 5, 2017·4 cites·32 claims
- 0573US10497092B2Continuous light inspectionCAMTEK LTD·Filed 2016·Granted Dec 3, 2019·2 cites·22 claims
- 0664US9147102B2Method and system for measuring bumps based on phase and amplitude informationKOREN SHIMON·Filed 2012·Granted Sep 29, 2015·2 cites·16 claims
- 0761US8731274B2Method and system for wafer registrationLANGMANS ELDAD·Filed 2011·Granted May 20, 2014·3 cites·10 claims
- 0857US12315206B2Inspection system for edge and bevel inspection of semiconductor structuresCAMTEK LTD·Filed 2024·Granted May 27, 2025·0 cites·19 claims
- 0953US8699784B2Inspection recipe generation and inspection based on an inspection recipeLANGMATZ ELDAD·Filed 2011·Granted Apr 15, 2014·2 cites·33 claims
- 1045US2016321792A1System and a method for automatic recipe validation and selectionCAMTEK LTD·Filed 2016·Application pending·0 cites
- 1142US9759555B2High throughput triangulation systemCAMTEK LTD·Filed 2016·Granted Sep 12, 2017·0 cites·24 claims
- 1236US10598607B2Objective lensCAMTEK LTD·Filed 2018·Granted Mar 24, 2020·0 cites·23 claims
- 1334US2016366315A1Aperture stopCAMTEK LTD·Filed 2016·Application pending·0 cites
- 1433US2011184694A1Depth measurements of narrow holesCAMTEK LTD·Filed 2008·Application pending·0 cites
- 1530US10215707B2System for inspecting a backside of a waferCAMTEK LTD·Filed 2016·Granted Feb 26, 2019·0 cites·35 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →