Inventor · disambiguated record
Chia-Yi Tseng
Also filed as: TSENG CHIA-YI
6 granted patents·4 pending applications·5 citations·filing 2017–2023
72Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD10
Top patents by PatentIndex Score
10 records- 0190US11430733B2Method of testing waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Aug 30, 2022·2 cites·20 claims
- 0284US10818595B2Semiconductor structure, testing and fabricating methods thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Oct 27, 2020·3 cites·15 claims
- 0376US12009302B2Method of testing waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jun 11, 2024·0 cites·20 claims
- 0458US10672777B2Method of manufacturing semiconductor device having multi-height structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jun 2, 2020·0 cites·20 claims
- 0551US10211214B2Semiconductor device having milti-height structure and method of manufacturing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Feb 19, 2019·0 cites·20 claims
- 0649US2025022940A1Semiconductor devices with improved gate controlTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 0748US2024429304A1Active region trimming after formation of source/drain componentsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 0848US2024429285A1Semiconductor devices with improved leakage current controlTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 0948US2024421228A1Noise transistorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 1046US10037927B2Semiconductor structure, testing and fabricating method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jul 31, 2018·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →