Inventor · disambiguated record
Ulf Hackius
Also filed as: HACKIUS ULF
3 granted patents·4 pending applications·10 citations·filing 2006–2016
63Inventor score
Files withSUSS MICRO TEC TEST SYSTEMS GM2SUSS MICROTEC TEST SYS GMBH2CASCADE MICROTECH INC1KANEV STOJAN1TEICH MICHAEL1
Top patents by PatentIndex Score
7 records- 0173US8072586B2Arrangement and method for focusing a multiplane image acquisition on a proberTEICH MICHAEL·Filed 2010·Granted Dec 6, 2011·4 cites·4 claims
- 0270US9194885B2Modular prober and method for operating sameKANEV STOJAN·Filed 2011·Granted Nov 24, 2015·3 cites·11 claims
- 0350US7573283B2Method for measurement of a device under testSUSS MICRO TEC TEST SYSTEMS GM·Filed 2007·Granted Aug 11, 2009·3 cites·15 claims
- 0440US2008284457A1Method and apparatus for control of a positioning deviceSUSS MICROTEC TEST SYS GMBH·Filed 2008·Application pending·0 cites
- 0537US2008212078A1Arrangement and method for focusing a multiplane image acquisition on a proberSUSS MICRO TEC TEST SYSTEMS GM·Filed 2007·Application pending·0 cites
- 0637US2007064992A1Process for the inspection of a variety of repetitive structuresSUSS MICROTEC TEST SYS GMBH·Filed 2006·Application pending·0 cites
- 0727US2017248973A1Probe systems and methods including active environmental controlCASCADE MICROTECH INC·Filed 2016·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →