Inventor · disambiguated record
Akifumi Ooshima
Also filed as: OOSHIMA AKIFUMI
2 granted patents·1 pending application·19 citations·filing 2001–2003
60Inventor score
Files withSONY CORP2
Top patents by PatentIndex Score
3 records- 0169US6933185B2Polysilicon evaluating method, polysilicon inspection apparatus and method for preparation of thin film transistorSONY CORP·Filed 2003·Granted Aug 23, 2005·11 cites·4 claims
- 0254US6798498B2Apparatus for evaluating polysilicon filmSONY CORP·Filed 2002·Granted Sep 28, 2004·8 cites·9 claims
- 0338US2001038105A1Polysilicon evaluating method, polysilicon inspection apparatus and method for preparation of thin film transistorFiled 2001·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →