Inventor · disambiguated record
Toshinobu Ono
Also filed as: ONO TOSHINOBU
3 granted patents·31 citations·filing 1994–2008
66Inventor score
Technology areasG01R
Top patents by PatentIndex Score
3 records- 0156US6334199B1Method of generating test patterns for a logic circuit, a system performing the method, and a computer readable medium instructing the system to perform the methodNEC CORP·Filed 1999·Granted Dec 25, 2001·22 cites·27 claims
- 0238US5502730APartial scan testability utilizing reconvergence through sequential elementsNEC USA INC·Filed 1994·Granted Mar 26, 1996·9 cites·18 claims
- 0337US8441277B2Semiconductor testing device, semiconductor device, and testing methodNOGUCHI KOICHIRO·Filed 2008·Granted May 14, 2013·0 cites·14 claims
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