Inventor · disambiguated record

Yu-Han Jeong

Also filed as: JEONG YU-HAN

1 granted patent·6 citations·filing 2005–2005

28Inventor score

Technology areasG06T

Files withSAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

1 record

0167US7601555B2Wafer inspection system and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 13, 2009·6 cites·18 claims

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