Inventor · disambiguated record
Yoshiteru Shikakura
Also filed as: SHIKAKURA YOSHITERU
11 granted patents·2 pending applications·35 citations·filing 2001–2021
85Inventor score
Files withHITACHI HIGH TECH SCIENCE CORP4SII NANOTECHNOLOGY INC4HITACHI HIGH TECH CORP1KONDO KAZUSHIGE1SEIKO INSTR INC1
Top patents by PatentIndex Score
13 records- 0191US8024816B2Approach method for probe and sample in scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2010·Granted Sep 20, 2011·13 cites·7 claims
- 0276US7284415B2Scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2005·Granted Oct 23, 2007·5 cites·12 claims
- 0372US8615811B2Method of measuring vibration characteristics of cantileverSHIGENO MASATSUGU·Filed 2012·Granted Dec 24, 2013·3 cites·13 claims
- 0457US6596992B2Method of operating scanning probe microscopeSEIKO INSTR INC·Filed 2001·Granted Jul 22, 2003·12 cites·20 claims
- 0556US11391755B2Scanning probe microscope and setting method thereofHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Granted Jul 19, 2022·0 cites·7 claims
- 0653US9354248B2Method for measuring vibration characteristic of cantileverHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted May 31, 2016·0 cites·5 claims
- 0749US8495759B2Probe aligning method for probe microscope and probe microscope operated by the sameWAKIYAMA SHIGERU·Filed 2009·Granted Jul 23, 2013·2 cites·12 claims
- 0848US2024168052A1Scanning Probe Microscope, Sample Observation Processing System, and Electric Characteristic Evaluation DeviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 0946US10712363B2Scanning probe microscopeHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted Jul 14, 2020·0 cites·8 claims
- 1045US7997124B2Scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2007·Granted Aug 16, 2011·0 cites·20 claims
- 1144US2007278177A1Processing method using atomic force microscope microfabrication deviceKONDO KAZUSHIGE·Filed 2007·Application pending·0 cites
- 1242US9921241B2Scanning probe microscope and measurement range adjusting method for scanning probe microscopeHITACHI HIGH TECH SCIENCE CORP·Filed 2016·Granted Mar 20, 2018·0 cites·5 claims
- 1341US7442925B2Working method using scanning probeSII NANOTECHNOLOGY INC·Filed 2006·Granted Oct 28, 2008·0 cites·20 claims
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