Inventor · disambiguated record
Masatsugu Shigeno
Also filed as: SHIGENO MASATSUGU
26 granted patents·2 pending applications·114 citations·filing 1988–2021
94Inventor score
Files withHITACHI HIGH TECH SCIENCE CORP9SII NANOTECHNOLOGY INC7SHIGENO MASATSUGU5SEIKO INSTR INC4AGENCY IND SCIENCE TECHN1
Top patents by PatentIndex Score
28 records- 0188US7170054B2Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holderSII NANOTECHNOLOGY INC·Filed 2005·Granted Jan 30, 2007·12 cites·14 claims
- 0286US7973942B2Optical displacement detection mechanism and surface information measurement device using the sameSII NANOTECHNOLOGY INC·Filed 2007·Granted Jul 5, 2011·13 cites·14 claims
- 0383US4902892AMethod of measurement by scanning tunneling microscopeAGENCY IND SCIENCE TECHN·Filed 1988·Granted Feb 20, 1990·49 cites·10 claims
- 0476US7861577B2Electric potential difference detection method and scanning probe microscopeSEIKO INSTR INC·Filed 2007·Granted Jan 4, 2011·6 cites·23 claims
- 0575US7605368B2Vibration-type cantilever holder and scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2006·Granted Oct 20, 2009·6 cites·25 claims
- 0672US8615811B2Method of measuring vibration characteristics of cantileverSHIGENO MASATSUGU·Filed 2012·Granted Dec 24, 2013·3 cites·13 claims
- 0766US8214915B2Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantileverSHIGENO MASATSUGU·Filed 2009·Granted Jul 3, 2012·4 cites·32 claims
- 0862US7614288B2Scanning probe microscope fine-movement mechanism and scanning probe microscope using sameSII NANOTECHNOLOGY INC·Filed 2007·Granted Nov 10, 2009·3 cites·20 claims
- 0961US7456400B2Scanning probe microscope and scanning methodSEIKO INSTR INC·Filed 2005·Granted Nov 25, 2008·7 cites·18 claims
- 1060US8608373B2Softening point measuring apparatus and thermal conductivity measuring apparatusANDO KAZUNORI·Filed 2010·Granted Dec 17, 2013·1 cites·12 claims
- 1159US10837982B2Scanning probe microscope and scanning method using the sameHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted Nov 17, 2020·0 cites·11 claims
- 1259US7823470B2Cantilever and cantilever manufacturing methodSEIKO INSTR INC·Filed 2007·Granted Nov 2, 2010·3 cites·7 claims
- 1358US7945965B2Sensor for observations in liquid environments and observation apparatus for use in liquid environmentsSII NANOTECHNOLOGY INC·Filed 2009·Granted May 17, 2011·2 cites·10 claims
- 1456US11391755B2Scanning probe microscope and setting method thereofHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Granted Jul 19, 2022·0 cites·7 claims
- 1556US7375322B2Cantilever holder and scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2006·Granted May 20, 2008·2 cites·10 claims
- 1653US9354248B2Method for measuring vibration characteristic of cantileverHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted May 31, 2016·0 cites·5 claims
- 1751US10345335B2Scanning probe microscope and scanning method thereofHITACHI HIGH TECH SCIENCE CORP·Filed 2018·Granted Jul 9, 2019·0 cites·15 claims
- 1851US8719959B2Cantilever, cantilever system, and probe microscope and adsorption mass sensor including the cantilever systemSHIGENO MASATSUGU·Filed 2009·Granted May 6, 2014·1 cites·28 claims
- 1949US2005212010A1Micro-protruding structureSHIGENO MASATSUGU·Filed 2005·Application pending·0 cites
- 2046US2008272301A1Micro-protruding structureSHIGENO MASATSUGU·Filed 2008·Application pending·0 cites
- 2145US8859279B2Cell detachment methodNIHEI AMIKO·Filed 2007·Granted Oct 14, 2014·0 cites·17 claims
- 2244US9766267B2Actuator position calculation device, actuator position calculation method, and actuator position calculation programHITACHI HIGH-TECH SCIENCE CORP·Filed 2014·Granted Sep 19, 2017·0 cites·6 claims
- 2342US10151773B2Scanning probe microscope and probe contact detection methodHITACHI HIGH TECH SCIENCE CORP·Filed 2017·Granted Dec 11, 2018·0 cites·4 claims
- 2442US9921241B2Scanning probe microscope and measurement range adjusting method for scanning probe microscopeHITACHI HIGH TECH SCIENCE CORP·Filed 2016·Granted Mar 20, 2018·0 cites·5 claims
- 2542US9645170B2Scanning probe microscopeHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted May 9, 2017·0 cites·9 claims
- 2642US7026607B2Scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2004·Granted Apr 11, 2006·2 cites·20 claims
- 2740US7580125B2Liquid cellSEIKO INSTR INC·Filed 2006·Granted Aug 25, 2009·0 cites·17 claims
- 2834US10161958B2Three-dimensional fine movement deviceHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted Dec 25, 2018·0 cites·5 claims
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