Inventor · disambiguated record
Yongjun Zheng
Also filed as: ZHENG YONGJUN
9 granted patents·2 pending applications·17 citations·filing 2007–2022
81Inventor score
Top patents by PatentIndex Score
11 records- 0178US8000519B1Method of metal pattern inspection verificationXILINX INC·Filed 2007·Granted Aug 16, 2011·7 cites·19 claims
- 0277US9646900B2Programmable addressable test chipSEMITRONIX CORP·Filed 2015·Granted May 9, 2017·3 cites·18 claims
- 0362US11668748B2Addressable test chipSEMITRONIX CORP·Filed 2022·Granted Jun 6, 2023·0 cites·14 claims
- 0461US8166445B1Estimating Icc current temperature scaling factor of an integrated circuitCHEN CINTI X·Filed 2009·Granted Apr 24, 2012·2 cites·20 claims
- 0559US10254339B2Addressable test chip test systemSEMITRONIX CORP·Filed 2017·Granted Apr 9, 2019·0 cites·19 claims
- 0655US9407041B2Anti-disengaging mechanism of cable connectorFU ZHOU LIU FANG MECH AND ELECTRICAL CO LTD·Filed 2014·Granted Aug 2, 2016·5 cites·17 claims
- 0744US10156605B2Addressable ring oscillator test chipSEMITRONIX CORP·Filed 2015·Granted Dec 18, 2018·0 cites·18 claims
- 0844US9146270B2Method for testing a plurality of transistors in a target chipSEMITRONIX CORP·Filed 2014·Granted Sep 29, 2015·0 cites·8 claims
- 0941US2014115547A1Method of Generating Parameterized UnitsSEMITRONIX CORP·Filed 2013·Application pending·0 cites
- 1041US2015042372A1Addressable test circuit and test method for key parameters of transistorsSEMITRONIX CORP·Filed 2014·Application pending·0 cites
- 1136US9817058B2Addressable test circuit and test method for key parameters of transistorsSEMITRONIX CORP·Filed 2016·Granted Nov 14, 2017·0 cites·19 claims
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